First principles study on the electronic transport properties of C60 and B80 molecular bridges
文献类型:期刊论文
作者 | X. H. Zheng1; H. Hao1; J. Lan1; X. L. Wang1; X. Q. Shi1,2; Z. Zeng1,3 |
刊名 | JOURNAL OF APPLIED PHYSICS |
出版日期 | 2014 |
卷号 | 116期号:7页码:1-6 |
源URL | [http://ir.hfcas.ac.cn/handle/334002/20582] |
专题 | 合肥物质科学研究院_中科院固体物理研究所 |
作者单位 | 1.Key Laboratory of Materials Physics, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031, China 2.Department of Physics, South University of Science and Technology of China, Shenzhen 518055, China 3.Department of Physics, University of Science and Technology of China, Hefei 230026, China |
推荐引用方式 GB/T 7714 | X. H. Zheng,H. Hao,J. Lan,et al. First principles study on the electronic transport properties of C60 and B80 molecular bridges[J]. JOURNAL OF APPLIED PHYSICS,2014,116(7):1-6. |
APA | X. H. Zheng,H. Hao,J. Lan,X. L. Wang,X. Q. Shi,&Z. Zeng.(2014).First principles study on the electronic transport properties of C60 and B80 molecular bridges.JOURNAL OF APPLIED PHYSICS,116(7),1-6. |
MLA | X. H. Zheng,et al."First principles study on the electronic transport properties of C60 and B80 molecular bridges".JOURNAL OF APPLIED PHYSICS 116.7(2014):1-6. |
入库方式: OAI收割
来源:合肥物质科学研究院
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