Thickness Dependence of Dielectric, Leakage, and Ferroelectric Properties of Bi6Fe2Ti3O18 Thin Films Derived by Chemical Solution Deposition
文献类型:期刊论文
作者 | Dongpo Song1,2; Xianwu Tang1![]() ![]() ![]() ![]() ![]() |
刊名 | J. Am. Ceram. Soc.
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出版日期 | 2014 |
卷号 | 97期号:12页码:3857-3863 |
源URL | [http://ir.hfcas.ac.cn/handle/334002/20985] ![]() |
专题 | 合肥物质科学研究院_中科院固体物理研究所 |
作者单位 | 1.Key Laboratory of Materials Physics, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031, China 2.University of Science and Technology of China, Hefei 230026, China 3.High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei 230031, China |
推荐引用方式 GB/T 7714 | Dongpo Song,Xianwu Tang,Bin Yuan,et al. Thickness Dependence of Dielectric, Leakage, and Ferroelectric Properties of Bi6Fe2Ti3O18 Thin Films Derived by Chemical Solution Deposition[J]. J. Am. Ceram. Soc.,2014,97(12):3857-3863. |
APA | Dongpo Song.,Xianwu Tang.,Bin Yuan.,Xuzhong Zuo.,Jie Yang.,...&Yuping Sun.(2014).Thickness Dependence of Dielectric, Leakage, and Ferroelectric Properties of Bi6Fe2Ti3O18 Thin Films Derived by Chemical Solution Deposition.J. Am. Ceram. Soc.,97(12),3857-3863. |
MLA | Dongpo Song,et al."Thickness Dependence of Dielectric, Leakage, and Ferroelectric Properties of Bi6Fe2Ti3O18 Thin Films Derived by Chemical Solution Deposition".J. Am. Ceram. Soc. 97.12(2014):3857-3863. |
入库方式: OAI收割
来源:合肥物质科学研究院
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