Na2O-Nb2O5-SiO2 based glass-ceramics with and without ZrO2/TiO2 were prepared by controlled crystallization, and their crystallization properties under different heat-treatment temperatures were characterized by differential scanning calorimetry, X-Ray Diffraction (XRD) and morphology observation. The XRD results indicated the presence of NaNbO3 with perovskite structure as the major crystalline phase. The introduction of ZrO2 contributed to the stabilization of the Na2O-Nb2O5-SiO2 basic glass, and thus improved their crystallization. Moreover, changes of the dielectric constant of the glass-ceramics with the frequency and measuring temperature were mainly studied. In details, the maximum dielectric constant reached 136.9 (@1000 KHz, 25 degrees C), and the rate of change with temperature is as small as about -0.0302/degrees C. The crystalline glass remains transparent in the range of 400-800 nm, and the transmittance is above 70% for the 2 mm thick sample. (C) 2018 The Electrochemical Society.