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Optical thickness measurement with single-shot dual-wavelength in-line digital holography

文献类型：期刊论文

作者Min, Junwei1,2; Zhou, Meiling1; Yuan, Xun1; Wen, Kai1,3; Yu, Xianghua1,2; Peng, Tong1,2; Yao, Baoli1,2
刊名Optics Letters
出版日期2018-09-15
卷号43期号:18页码:4469-4472
ISSN号01469592;15394794
DOI10.1364/OL.43.004469
产权排序1
英文摘要An algorithm for quantitative reconstruction of the optical thickness distribution of objects is proposed based on single-shot dual-wavelength in-line digital holography. Two single-wavelength holograms can be extracted from a single-shot recorded dual-wavelength in-line hologram. The quantitative optical thickness distribution of the specimen can be reconstructed directly without calculations of the phase images at every single wavelength. Thus, off-axis recording and phase-shifting operation are not required, enabling a fast and high-resolution measurement. The effectiveness and accuracy of the proposed method are verified by both numerical simulations and experimental results. ? 2018 Optical Society of America
语种英语
WOS记录号WOS:000444400100040
出版者OSA - The Optical Society
源URL[http://ir.opt.ac.cn/handle/181661/30633]  
专题西安光学精密机械研究所_瞬态光学技术国家重点实验室
通讯作者Yao, Baoli
作者单位1.State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an; 710119, China;
2.Xi’an Jiaotong University, No. 28 Xianning West Road, Xi’an; 710049, China;
3.College of Physics and Information Technology, Shaanxi Normal University, Xi’an; 710071, China
推荐引用方式
GB/T 7714		 Min, Junwei,Zhou, Meiling,Yuan, Xun,et al. Optical thickness measurement with single-shot dual-wavelength in-line digital holography[J]. Optics Letters,2018,43(18):4469-4472.
APA Min, Junwei.,Zhou, Meiling.,Yuan, Xun.,Wen, Kai.,Yu, Xianghua.,...&Yao, Baoli.(2018).Optical thickness measurement with single-shot dual-wavelength in-line digital holography.Optics Letters,43(18),4469-4472.
MLA Min, Junwei,et al."Optical thickness measurement with single-shot dual-wavelength in-line digital holography".Optics Letters 43.18(2018):4469-4472.

入库方式： OAI收割

来源：西安光学精密机械研究所

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