Measurement of the Muller matrix for painted surfaces with a kind of scatterometer
文献类型：会议论文
| 作者 | Feng,Weiwei ; Wei,Qingnong ; Chen,Lingxin |
| 出版日期 | 2010 |
| 会议日期 | 2010-04-26 |
| 会议地点 | . |
| 关键词 | Discrete Fourier Transforms Light Manufacture Measurement Theory Meteorological Instruments Optical Testing Polarization Reflection Rotation Surfaces Technology |
| 通讯作者 | Feng,W. |
| 英文摘要 | The polarized light scattered by the surface of a material contains information that can be used to describe the properties of the surfaces. Polarized Bidirectional Reflectance Distribution Function (BRDF) is one of the most important factors used to represent the property of the surface. It uses a 4x4 matrix (Mueller matrix) to describe the properties of the light scattered from the surface. In order to measure the Mueller matrix of the samples, a new three axis automated scatterometer has been developed to measure the Mueller matrix of painted surfaces. It can do measurement at any illumination and viewing geometric of the hemisphere and it is more convenient for far-field measurement is presented. The design of the instrument is different to the traditional scatterometer. The significant characteristic of the instrument is that the detector and polarization analyzer are fixed, while the source and the incident optical elements rotate on a stage together. All the possible incident and viewing positions can be reached through the rotation of three motors. The rotations of the motors are fed back through photoelectric- encoders, the "closed loop" control mode ensured the precision of the position. Through coordinate transformations, the measurement in three dimensions can be simplified in two dimensional form, the details of the coordinate transformations will be described in detail in this paper. The dualrotating retarders method is used to modulate polarizing and analyzing optics. Two retarders rotate synchronously at angular speed and respectively. For every position, 16 measurements were done, and the Discrete Fourier Transform (DFT) method is used to retrieve the Mueller matrix of the sample. Discrete Fourier Transform (DFT) method is used to retrieve the Mueller matrix of the sample. The results of out-plane polarized bidirectional reflectance distribution function for samples coated with different paints are presented. © 2010 Copyright SPIE - The International Society for Optical Engineering. |
| 产权排序 | (1) Yantai Institute of Coastal Zone Research for Sustainable Development, Chinese Academy of Sciences, Yantai, 264003, China; (2) Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, China |
| 会议录 | 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
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| 会议录出版者 | SPIE, P.O. Box 10, Bellingham, WA 98227-0010, United States |
| 学科主题 | 摄影测量与遥感 |
| 语种 | 英语 |
| URL标识 | 查看原文 |
| ISSN号 | ISSN:0277786X |
| 源URL | [http://ir.yic.ac.cn/handle/133337/4798]  |
| 专题 | 烟台海岸带研究所_环境化学实验室 |
| 推荐引用方式 GB/T 7714 | Feng,Weiwei,Wei,Qingnong,Chen,Lingxin. Measurement of the Muller matrix for painted surfaces with a kind of scatterometer[C]. 见:. .. 2010-04-26. |
入库方式： OAI收割
来源：烟台海岸带研究所
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