Enhancement Effects of the Terahertz Near-Field Microscopy
文献类型：期刊论文
| 作者 | Huang, Jian1; Yang, Zhongbo1 ; Wei, Dongshan1; Du, Chunlei1; Cui, Hong-Liang1,2
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| 刊名 | APPLIED SCIENCES-BASEL
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| 出版日期 | 2015-12-01 |
| 卷号 | 5期号:4页码:1745-1755 |
| 关键词 | terahertz nanotip finite difference time domain enhancement effect effective polarizability dielectric constant |
| ISSN号 | 2076-3417 |
| DOI | 10.3390/app5041745 |
| 通讯作者 | Wei, DS (reprint author), Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China. |
| 英文摘要 | Terahertz near-field detection based and imaging on a nanotip has drawn wide attention following extensive applications of terahertz imaging technologies. Through the local enhanced electric field created by a terahertz nanotip in the near field, it is very likely to attain superior detection sensitivity and higher spatial resolution. This paper simulates the local enhancement effects of the terahertz near-field microscopy using a two-dimension finite difference time domain (2D-FDTD) method. Factors that influence the enhancement effects are investigated and analyzed in detail. Simulation results show that the size of the nanotip apex, the apex-substrate distance, dielectric properties of the substrate and the detected sample, etc., have significant impacts on the electric field enhancement and spatial resolution of the terahertz near-field nanotip, which can be explained from the effective polarizability of the nanotip-sample/substrate system. |
| URL标识 | 查看原文 |
| 资助项目 | National 973 Program of China[2015CB755401] ; Fundamental & Advanced Research Project of Chongqing, China[cstc2013jcyjC00001] ; National Natural Science Foundation of China[31400625] ; National Natural Science Foundation of China[21407145] ; Chinese Academy of Sciences |
| WOS研究方向 | Chemistry ; Materials Science ; Physics |
| 语种 | 英语 |
| WOS记录号 | WOS:000367529300068 |
| 出版者 | MDPI AG |
| 源URL | [http://119.78.100.138/handle/2HOD01W0/2147]  |
| 专题 | 太赫兹技术研究中心 微纳制造与系统集成研究中心 |
| 通讯作者 | Wei, Dongshan |
| 作者单位 | 1.Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China 2.Jilin Univ, Coll Instrumentat Sci & Elect Engn, Changchun 130061, Peoples R China |
| 推荐引用方式 GB/T 7714 | Huang, Jian,Yang, Zhongbo,Wei, Dongshan,et al. Enhancement Effects of the Terahertz Near-Field Microscopy[J]. APPLIED SCIENCES-BASEL,2015,5(4):1745-1755. |
| APA | Huang, Jian,Yang, Zhongbo,Wei, Dongshan,Du, Chunlei,&Cui, Hong-Liang.(2015).Enhancement Effects of the Terahertz Near-Field Microscopy.APPLIED SCIENCES-BASEL,5(4),1745-1755. |
| MLA | Huang, Jian,et al."Enhancement Effects of the Terahertz Near-Field Microscopy".APPLIED SCIENCES-BASEL 5.4(2015):1745-1755. |
入库方式： OAI收割
来源：重庆绿色智能技术研究院
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