Camphor-Enabled Transfer and Mechanical Testing of Centimeter-Scale Ultrathin Films
文献类型:期刊论文
作者 | Wang, Bin1; Luo, Da1; Li, Zhancheng2![]() ![]() |
刊名 | ADVANCED MATERIALS
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出版日期 | 2018-07-12 |
卷号 | 30期号:28页码:8 |
关键词 | Camphor Graphene Mechanical Testing Transfer Ultrathin Films |
ISSN号 | 0935-9648 |
DOI | 10.1002/adma.201800888 |
英文摘要 | Camphor is used to transfer centimeter-scale ultrathin films onto custom-designed substrates for mechanical (tensile) testing. Compared to traditional transfer methods using dissolving/peeling to remove the support-layers, camphor is sublimed away in air at low temperature, thereby avoiding additional stress on the as-transferred films. Large-area ultrathin films can be transferred onto hollow substrates without damage by this method. Tensile measurements are made on centimeter-scale 300 nm-thick graphene oxide film specimens, much thinner than the approximate to 2 mu m minimum thickness of macroscale graphene-oxide films previously reported. Tensile tests were also done on two different types of large-area samples of adlayer free CVD-grown single-layer graphene supported by a approximate to 100 nm thick polycarbonate film; graphene stiffens this sample significantly, thus the intrinsic mechanical response of the graphene can be extracted. This is the first tensile measurement of centimeter-scale monolayer graphene films. The Young's modulus of polycrystalline graphene ranges from 637 to 793 GPa, while for near single-crystal graphene, it ranges from 728 to 908 GPa (folds parallel to the tensile loading direction) and from 683 to 775 GPa (folds orthogonal to the tensile loading direction), demonstrating the mechanical performance of large-area graphene in a size scale relevant to many applications. |
资助项目 | Institute for Basic Science[IBS-R019-D1] ; National Natural Science Foundation of China[51402291] |
WOS研究方向 | Chemistry ; Science & Technology - Other Topics ; Materials Science ; Physics |
语种 | 英语 |
WOS记录号 | WOS:000439994500021 |
出版者 | WILEY-V C H VERLAG GMBH |
源URL | [http://119.78.100.138/handle/2HOD01W0/6550] ![]() |
专题 | 微纳制造与系统集成研究中心 |
作者单位 | 1.IBS, CMCM, Ulsan 44919, South Korea 2.Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing 400714, Peoples R China 3.UNIST, Dept Chem, Ulsan 44919, South Korea 4.UNIST, Sch Mat Sci & Engn, Ulsan 44919, South Korea |
推荐引用方式 GB/T 7714 | Wang, Bin,Luo, Da,Li, Zhancheng,et al. Camphor-Enabled Transfer and Mechanical Testing of Centimeter-Scale Ultrathin Films[J]. ADVANCED MATERIALS,2018,30(28):8. |
APA | Wang, Bin.,Luo, Da.,Li, Zhancheng.,Kwon, Youngwoo.,Wang, Meihui.,...&Ruoff, Rodney S..(2018).Camphor-Enabled Transfer and Mechanical Testing of Centimeter-Scale Ultrathin Films.ADVANCED MATERIALS,30(28),8. |
MLA | Wang, Bin,et al."Camphor-Enabled Transfer and Mechanical Testing of Centimeter-Scale Ultrathin Films".ADVANCED MATERIALS 30.28(2018):8. |
入库方式: OAI收割
来源:重庆绿色智能技术研究院
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