Multiple superimposed probability tomography on a second electrical field
文献类型：期刊论文
| 作者 | Yan, Yongli1,3; Chen, Benchi2; Chen, Yun1; Ma, Xiaobing1 |
| 刊名 | JOURNAL OF GEOPHYSICS AND ENGINEERING
 |
| 出版日期 | 2009-03-01 |
| 卷号 | 6期号:1页码:82-86 |
| 关键词 | probability tomography second electrical field charge occurrence probability space domain scanning function |
| ISSN号 | 1742-2132 |
| DOI | 10.1088/1742-2132/6/1/009 |
| 文献子类 | Article |
| 英文摘要 | Based on the requirement of probability tomography, we developed two-directional pole-pole measurement on a 2D electrical imaging survey which is able to extract all second electrical field profiles to participate in probability tomography. The concept of charge occurrence probability (COP) is defined as the average of cross-correlation of the space domain scanning (SDS) function with the second electrical field being generated by a whole set of point current sources. To quantitatively analyse the results of the tomography, the COP values are normalized. Finally, in order to test the effectiveness of the tomography, we use a finite element algorithm to synthesize the potential data for 2D models, and the profiles of the second electrical field are extracted by eliminating the primary field from the total field. Using the second electrical field of all profiles, the geometric patterns of normalized COP (NCOP) values are reconstructed by means of multiple superimposed probability tomography. The results are quite satisfactory. |
| WOS关键词 | RESISTIVITY TOMOGRAPHY ; INVERSION |
| WOS研究方向 | Geochemistry & Geophysics |
| 语种 | 英语 |
| WOS记录号 | WOS:000263679000009 |
| 出版者 | IOP PUBLISHING LTD |
| 资助机构 | Natural Sciences Foundation of China(40774070, 40474048) ; Natural Sciences Foundation of China(40774070, 40474048) ; Natural Sciences Foundation of China(40774070, 40474048) ; Natural Sciences Foundation of China(40774070, 40474048) ; Natural Sciences Foundation of China(40774070, 40474048) ; Natural Sciences Foundation of China(40774070, 40474048) ; Natural Sciences Foundation of China(40774070, 40474048) ; Natural Sciences Foundation of China(40774070, 40474048) |
| 源URL | [http://ir.iggcas.ac.cn/handle/132A11/70512]  |
| 专题 | 中国科学院地质与地球物理研究所 |
| 通讯作者 | Yan, Yongli |
| 作者单位 | 1.Chinese Acad Sci, Inst Geol & Geophys, Beijing, Peoples R China 2.China Petr & Chem Corp, Tech Dept, Beijing, Peoples R China 3.Chinese Acad Sci, Key Lab Mineral Resources, Beijing, Peoples R China |
| 推荐引用方式 GB/T 7714 | Yan, Yongli,Chen, Benchi,Chen, Yun,et al. Multiple superimposed probability tomography on a second electrical field[J]. JOURNAL OF GEOPHYSICS AND ENGINEERING,2009,6(1):82-86. |
| APA | Yan, Yongli,Chen, Benchi,Chen, Yun,&Ma, Xiaobing.(2009).Multiple superimposed probability tomography on a second electrical field.JOURNAL OF GEOPHYSICS AND ENGINEERING,6(1),82-86. |
| MLA | Yan, Yongli,et al."Multiple superimposed probability tomography on a second electrical field".JOURNAL OF GEOPHYSICS AND ENGINEERING 6.1(2009):82-86. |
入库方式： OAI收割
来源：地质与地球物理研究所
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