中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Variation of the grand mean value of Si-O distances in metamorphic reactions

文献类型:期刊论文

作者Ye, DN; Li, Z; He, W
刊名CHINESE SCIENCE BULLETIN
出版日期2001-04-01
卷号46期号:8页码:702-704
关键词metamorphic reaction Si-O distance grand mean value
ISSN号1001-6538
文献子类Article
英文摘要The grand mean values of Si-O distances in both the left and the right sides of 33 metamorphic reaction equations have been calculated on the basis of data of single crystal structural refinement analysis. The results showed that the grand mean value of Si-O distances tends to decrease at high temperature, whereas that tends to increase at high pressure during a metamorphic reaction.
WOS研究方向Science & Technology - Other Topics
语种英语
WOS记录号WOS:000168737900024
出版者SCIENCE PRESS
源URL[http://ir.iggcas.ac.cn/handle/132A11/76739]  
专题中国科学院地质与地球物理研究所
通讯作者Ye, DN
作者单位Chinese Acad Sci, Inst Geol & Geophys, Beijing 100029, Peoples R China
推荐引用方式
GB/T 7714
Ye, DN,Li, Z,He, W. Variation of the grand mean value of Si-O distances in metamorphic reactions[J]. CHINESE SCIENCE BULLETIN,2001,46(8):702-704.
APA Ye, DN,Li, Z,&He, W.(2001).Variation of the grand mean value of Si-O distances in metamorphic reactions.CHINESE SCIENCE BULLETIN,46(8),702-704.
MLA Ye, DN,et al."Variation of the grand mean value of Si-O distances in metamorphic reactions".CHINESE SCIENCE BULLETIN 46.8(2001):702-704.

入库方式: OAI收割

来源:地质与地球物理研究所

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