A Novel Method to Evaluate the RFID System Reliability
文献类型：会议论文
| 作者 | Xie JW(谢家文) ; Wang ML(王敏丽); Tan J(谭杰); Xie JW(谢家文)
|
| 出版日期 | 2017-02 |
| 会议日期 | 2016.11.28-2016.11.30 |
| 会议地点 | 郑州 |
| 关键词 | Rfid System Data-driver Least Squares Reliability |
| 卷号 | 174 |
| DOI | 10.1016/j.proeng.2017.01.167 |
| 页码 | 465–469 |
| 英文摘要 | The RFID system application environment may be different,this have huge influence to the RFID system reliability.This paper presents a data-driven model to evaluate the reliability of RFID systems by analyzing the factors that affect RFID system raliability. We construct free-space and semi-closed metal environment two scenarios by using the proposed model to determine the reliable reference parameter range in these scenarios. The experimental results show that the proposed model can evaluate the reliability of RFID system easily and quickly in different application scenarios. |
| 项目编号 | 2014BAF07B04 |
| 语种 | 英语 |
| 源URL | [http://ir.ia.ac.cn/handle/173211/14498]  |
| 专题 | 自动化研究所_综合信息系统研究中心 |
| 通讯作者 | Xie JW(谢家文) |
| 作者单位 | 中国科学院自动化研究所 |
| 推荐引用方式 GB/T 7714 | Xie JW,Wang ML,Tan J,et al. A Novel Method to Evaluate the RFID System Reliability[C]. 见:. 郑州. 2016.11.28-2016.11.30. |
入库方式： OAI收割
来源：自动化研究所
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