Path Delay Test generation Toward Activation of worst Case Coupling Effects
文献类型：期刊论文
| 作者 | minjin, zhang1 ; Huawei, Li2; Xiaowei,Li2
|
| 刊名 | IEEE Transactions on Very Large Scale Integration (VLSI) Systems
 |
| 出版日期 | 2011-11 |
| 卷号 | 19期号:11页码:1969-1982 |
| 关键词 | Crosstalk-induced Delay Delay Testing Path Delay Fault Signal Integrity Test Generation Timing Analysis |
| 英文摘要 | ; As the feature size scales down, crosstalk noise on circuit timing becomes increasingly significant. In this paper, we propose a path delay test generation method toward activation of worst case crosstalk effects, in order to decrease the test escape of delay testing. The proposed method performs transition- map-based timing analysis to identify crosstalk-sensitive critical paths, followed by a deterministic test generation process. Using the transition map instead of the timing window to manage the timing information, the proposed method can identify many false coupling sites and thus reduce the pessimism in crosstalk-induced fault collection caused by inaccurate timing analysis. It can also efficiently calculate the accumulative crosstalk-induced delay, and find the sub-paths which cause worst case crosstalk effects during test generation. By converting the timing constraints of coupling lines into logic constraints, complex timing processing for crosstalk effect activation is avoided during test generation. In addition, the tradeoff between accuracy and efficiency can be explored by varying the size of timescale used in the transition map. |
| WOS记录号 | WOS:000294869500004 |
| 源URL | [http://ir.ia.ac.cn/handle/173211/15398]  |
| 专题 | 自动化研究所_国家专用集成电路设计工程技术研究中心 |
| 作者单位 | 1.Institute of Automation, Chinese Academy of Sciences 2.Institute of Computing Technology, Chinese Academy of Sciences |
| 推荐引用方式 GB/T 7714 | minjin, zhang,Huawei, Li,Xiaowei,Li. Path Delay Test generation Toward Activation of worst Case Coupling Effects[J]. IEEE Transactions on Very Large Scale Integration (VLSI) Systems,2011,19(11):1969-1982. |
| APA | minjin, zhang,Huawei, Li,&Xiaowei,Li.(2011).Path Delay Test generation Toward Activation of worst Case Coupling Effects.IEEE Transactions on Very Large Scale Integration (VLSI) Systems,19(11),1969-1982. |
| MLA | minjin, zhang,et al."Path Delay Test generation Toward Activation of worst Case Coupling Effects".IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19.11(2011):1969-1982. |
入库方式： OAI收割
来源：自动化研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。