Reliability Oriented Selective Triple Modular Redundancy for SRAM-Based FPGAs
文献类型：期刊论文
| 作者 | Zheng, Meisong ; Wang, Zilong; Tu, Ji; Wang, Junye; Li, Lijian
|
| 刊名 | Applied Mechanics and Materials
 |
| 出版日期 | 2014-11 |
| 期号 | 713-715页码:1127-1131 |
| 关键词 | Fpga Tmr Windowing Seu |
| 英文摘要 | This paper presents an improved approach to Triple Modular Redundancy (TMR) which concerns don’ t care bits of LUT configuration bits and hence classifies the set of LUTs into SEU-sensitive and SEU-insensitive. Unlike the full TMR approach, the improved approach only triplicates SEU-sensitive LUTs and can greatly reduces the area overhead while maintaining the circuit reliability. The proposed approach is thoroughly tested on the MCNC’91 benchmarks. Compare with the full TMR method the proposed scheme can reduce the area overhead by 26.6% on average, at the same time the circuit reliability only reduced by 9.1 %. The improved approach can also increase mean time between failures (MTBF) by an average of six times more than the original circuit. |
| 源URL | [http://ir.ia.ac.cn/handle/173211/11751]  |
| 专题 | 自动化研究所_空天信息研究中心 |
| 通讯作者 | Li, Lijian |
| 作者单位 | 中国科学院自动化研究所 |
| 推荐引用方式 GB/T 7714 | Zheng, Meisong,Wang, Zilong,Tu, Ji,et al. Reliability Oriented Selective Triple Modular Redundancy for SRAM-Based FPGAs[J]. Applied Mechanics and Materials,2014(713-715):1127-1131. |
| APA | Zheng, Meisong,Wang, Zilong,Tu, Ji,Wang, Junye,&Li, Lijian.(2014).Reliability Oriented Selective Triple Modular Redundancy for SRAM-Based FPGAs.Applied Mechanics and Materials(713-715),1127-1131. |
| MLA | Zheng, Meisong,et al."Reliability Oriented Selective Triple Modular Redundancy for SRAM-Based FPGAs".Applied Mechanics and Materials .713-715(2014):1127-1131. |
入库方式： OAI收割
来源：自动化研究所
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