Calibration of instrument and sample parameters for small angle X-ray scattering
文献类型：期刊论文
| 作者 | Wei YR(魏彦茹); Li ZH(李志宏) ; Wei, YR; Li, ZH
|
| 刊名 | INSTRUMENTATION SCIENCE & TECHNOLOGY
 |
| 出版日期 | 2016 |
| 卷号 | 44期号:5页码:521-536 |
| 关键词 | Detector tilt instrument parameters small angle X-ray scattering small angle X-ray scattering calibration |
| DOI | 10.1080/10739149.2016.1143838 |
| 通讯作者 | 李志宏 |
| 文献子类 | 期刊论文 |
| 英文摘要 | A method for calibrating the parameters of a small angle X-ray scattering instrument using the diffraction ring of a standard sample is presented. A generalized geometric model for small angle X-ray scattering was constructed and detailed mathematical derivations presented to solve for the relevant instrument parameters, which were then used to convert two-dimensional small angle X-ray scattering data to standard curves. The method is valid regardless whether the detector photosensitive plane is perpendicular or tilted with respect to the beam. Small angle X-ray scattering was performed using standard calibration samples to validate the methodology. |
| WOS关键词 | POWDER DIFFRACTION ; DETECTOR ; SYSTEM |
| 语种 | 英语 |
| WOS记录号 | WOS:000379603200007 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/260254]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Wei YR,Li ZH,Wei, YR,et al. Calibration of instrument and sample parameters for small angle X-ray scattering[J]. INSTRUMENTATION SCIENCE & TECHNOLOGY,2016,44(5):521-536. |
| APA | 魏彦茹,李志宏,Wei, YR,&Li, ZH.(2016).Calibration of instrument and sample parameters for small angle X-ray scattering.INSTRUMENTATION SCIENCE & TECHNOLOGY,44(5),521-536. |
| MLA | 魏彦茹,et al."Calibration of instrument and sample parameters for small angle X-ray scattering".INSTRUMENTATION SCIENCE & TECHNOLOGY 44.5(2016):521-536. |
入库方式： OAI收割
来源：高能物理研究所
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