Application of Mythen detector: In-situ XRD study on the thermal expansion behavior of metal indium
文献类型:期刊论文
作者 | Du R(杜蓉); Chen ZJ(陈中军)![]() ![]() ![]() |
刊名 | SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY
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出版日期 | 2016 |
卷号 | 59期号:7 |
关键词 | Mythen detector thermal expansion Rietveld refinement XRD indium foil |
DOI | 10.1007/s11433-015-0436-0 |
通讯作者 | 吴忠华 |
文献子类 | 期刊论文 |
英文摘要 | A Mythen detector has been equipped at the beamline 4B9A of Beijing Synchrotron Radiation Facility (BSRF), which is expected to enable BSRF to perform time-resolved measurement of X-ray diffraction (XRD) full-profiles. In this paper, the thermal expansion behavior of metal indium has been studied by using the in-situ XRD technique with the Mythen detector. The indium was heated from 303 to 433 K with a heating rate of 2 K/min. The in-situ XRD full-profiles were collected with a rate of one profile per 10 seconds. Rietveld refinement was used to extract the structural parameters. The results demonstrate that these collected quasi-real-time XRD profiles can be well used for structural analysis. The metal indium was found to have a nonlinear thermal expansion behavior from room temperature to the melting point (429.65 K). The a-axis of the tetragonal unit cell expands with a biquadratic dependency on temperature, while the c-axis contracts with a cubic dependency on temperature. By the time-resolved XRD measurements, it was observed that the [200] preferred orientation can maintain to about 403.15 K. While (110) is the last and detectable crystal plane just before melting of the polycrystalline indium foil. This study is not only beneficial to the application of metal indium, but also exhibits the capacity of in-situ time-resolved XRD measurements at the X-ray diffraction station of BSRF. |
WOS关键词 | MATRIX COMPOSITES ; THIN-FILM ; TEMPERATURE ; CERAMICS ; CRYSTALS ; SOLIDS ; TIN |
语种 | 英语 |
WOS记录号 | WOS:000375574700007 |
源URL | [http://ir.ihep.ac.cn/handle/311005/260272] ![]() |
专题 | 中国科学院高能物理研究所 |
作者单位 | 中国科学院高能物理研究所 |
推荐引用方式 GB/T 7714 | Du R,Chen ZJ,Cai Q,et al. Application of Mythen detector: In-situ XRD study on the thermal expansion behavior of metal indium[J]. SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY,2016,59(7). |
APA | 杜蓉.,陈中军.,蔡泉.,付建龙.,宫宇.,...&Wu, ZH.(2016).Application of Mythen detector: In-situ XRD study on the thermal expansion behavior of metal indium.SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY,59(7). |
MLA | 杜蓉,et al."Application of Mythen detector: In-situ XRD study on the thermal expansion behavior of metal indium".SCIENCE CHINA-PHYSICS MECHANICS & ASTRONOMY 59.7(2016). |
入库方式: OAI收割
来源:高能物理研究所
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