In situ Raman and synchrotron X-ray diffraction study on crystallization of Choline chloride/Urea deep eutectic solvent under high pressure
文献类型：期刊论文
| 作者 | Li XD(李晓东) ; Yuan, CS; Chu, KK; Li, HN; Su, L; Yang, K; Wang, YQ; Li, XD
|
| 刊名 | CHEMICAL PHYSICS LETTERS
 |
| 出版日期 | 2016 |
| 卷号 | 661页码:240-245 |
| 关键词 | High pressure Raman Deep eutectic solvent ChCl Urea |
| DOI | 10.1016/j.cplett.2016.04.011 |
| 英文摘要 | Pressure-induced crystallization of Choline chloride/Urea (ChCl/Urea) deep eutectic solvent (DES) has been investigated by in-situ Raman spectroscopy and synchrotron X-ray diffraction. The results indicated that high pressure crystals appeared at around 2.6 GPa, and the crystalline structure was different from that formed at ambient pressure. Upon increasing the pressure, the N-H stretching modes of Urea underwent dramatic change after liquid-solid transition. It appears that high pressures may enhance the hydrogen bonds formed between ChCl and Urea. P versus T phase diagram of ChCl/Urea DES was constructed, and the crystallization mechanism of ChCl/Urea DES was discussed in view of hydrogen bonds. (C) 2016 Elsevier B.V. All rights reserved. |
| 语种 | 英语 |
| WOS记录号 | WOS:000385332600042 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/260325]  |
| 专题 | 高能物理研究所_多学科研究中心 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Li XD,Yuan, CS,Chu, KK,et al. In situ Raman and synchrotron X-ray diffraction study on crystallization of Choline chloride/Urea deep eutectic solvent under high pressure[J]. CHEMICAL PHYSICS LETTERS,2016,661:240-245. |
| APA | 李晓东.,Yuan, CS.,Chu, KK.,Li, HN.,Su, L.,...&Li, XD.(2016).In situ Raman and synchrotron X-ray diffraction study on crystallization of Choline chloride/Urea deep eutectic solvent under high pressure.CHEMICAL PHYSICS LETTERS,661,240-245. |
| MLA | 李晓东,et al."In situ Raman and synchrotron X-ray diffraction study on crystallization of Choline chloride/Urea deep eutectic solvent under high pressure".CHEMICAL PHYSICS LETTERS 661(2016):240-245. |
入库方式： OAI收割
来源：高能物理研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。