Radiation hardness of two CMOS prototypes for the ATLAS HL-LHC upgrade project
文献类型：期刊论文
| 作者 | Huffman, BT; Affolder, A; Arndt, K; Bates, R; Benoit, M; Di Bello, F; Blue, A; Bortoletto, D; Buckland, M; Buttar, C |
| 刊名 | JOURNAL OF INSTRUMENTATION
 |
| 出版日期 | 2016 |
| 卷号 | 11 |
| 关键词 | Radiation damage to electronic components Solid state detectors Radiation-hard detectors Particle tracking detectors (Solid-state detectors) |
| DOI | 10.1088/1748-0221/11/02/C02005 |
| 文献子类 | Article; Proceedings Paper |
| 英文摘要 | The LHC luminosity upgrade, known as the High Luminosity LHC (HL-LHC), will require the replacement of the existing silicon strip tracker and the transistion radiation tracker. Although a baseline design for this tracker exists the ATLAS collaboration and other non-ATLAS groups are exploring the feasibility of using CMOS Monolithic Active Pixel Sensors (MAPS) which would be arranged in a strip-like fashion and would take advantage of the service and support structure already being developed for the upgrade. Two test devices made with theAMSH35 process (a High voltage or HV CMOS process) have been subjected to various radiation environments and have performed well. The results of these tests are presented in this paper. |
| WOS关键词 | PIXEL DETECTORS ; TECHNOLOGY |
| 语种 | 英语 |
| WOS记录号 | WOS:000371479800005 |
| 源URL | [http://ir.ihep.ac.cn/handle/311005/260991]  |
| 专题 | 高能物理研究所_实验物理中心 |
| 作者单位 | 中国科学院高能物理研究所 |
| 推荐引用方式 GB/T 7714 | Huffman, BT,Affolder, A,Arndt, K,et al. Radiation hardness of two CMOS prototypes for the ATLAS HL-LHC upgrade project[J]. JOURNAL OF INSTRUMENTATION,2016,11. |
| APA | Huffman, BT.,Affolder, A.,Arndt, K.,Bates, R.,Benoit, M.,...&朱宏博.(2016).Radiation hardness of two CMOS prototypes for the ATLAS HL-LHC upgrade project.JOURNAL OF INSTRUMENTATION,11. |
| MLA | Huffman, BT,et al."Radiation hardness of two CMOS prototypes for the ATLAS HL-LHC upgrade project".JOURNAL OF INSTRUMENTATION 11(2016). |
入库方式： OAI收割
来源：高能物理研究所
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