on statistical properties of s-boxes in block ciphers
文献类型：期刊论文
| 作者 | Hua C ; Wu CK ; Feng DG |
| 刊名 | CHINESE JOURNAL OF ELECTRONICS
 |
| 出版日期 | 2005 |
| 卷号 | 14期号:4页码:584-587 |
| 关键词 | block cipher S-box bias test |
| ISSN号 | 1022-4653 |
| 学科主题 | Engineering, Electrical & Electronic |
| 收录类别 | SCI ; EI |
| 语种 | 英语 |
| WOS记录号 | WOS:000237133300006 |
| 公开日期 | 2011-07-28 |
| 附注 | S-boxes being core nonlinear components play a very important role in traditional block ciphers. Well-designed S-boxes will contribute to the security of a block cipher significantly, and security measurement of S-boxes has attracted much interest. Besides many measurements for S-boxes in block ciphers, this paper proposes a new measurement on the statistical property, namely bias test of S-boxes, and gives analysis of the S-boxes in Rijndael and Crypton using the new measurement. It shows that the S-box of Rijndael performs better than that of Crypton under the new measurement. Some relationships between the new measurement and algebraic properties have also been explored. |
| 源URL | [http://124.16.136.157/handle/311060/12464]  |
| 专题 | 软件研究所_软件所图书馆_期刊论文 |
| 推荐引用方式 GB/T 7714 | Hua C,Wu CK,Feng DG. on statistical properties of s-boxes in block ciphers[J]. CHINESE JOURNAL OF ELECTRONICS,2005,14(4):584-587. |
| APA | Hua C,Wu CK,&Feng DG.(2005).on statistical properties of s-boxes in block ciphers.CHINESE JOURNAL OF ELECTRONICS,14(4),584-587. |
| MLA | Hua C,et al."on statistical properties of s-boxes in block ciphers".CHINESE JOURNAL OF ELECTRONICS 14.4(2005):584-587. |
入库方式： OAI收割
来源：软件研究所
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