Corrected runs distribution test for pseudorandom number generators
文献类型：期刊论文
| 作者 | Fan, LM ; Chen, H ; Chen, MH ; Gao, S |
| 刊名 | ELECTRONICS LETTERS
 |
| 出版日期 | 2016 |
| 卷号 | 52期号:4页码:281-282 |
| 关键词 | random number generation statistical analysis pseudorandom number generators corrected runs distribution test Golomb randomness postulates statistical test suites AIS20 FIPS140 CryptX DRBG two-level evaluation approach NIST SP 800-22 |
| ISSN号 | 0013-5194 |
| 中文摘要 | Runs distribution test is an important statistical test based on Golomb's randomness postulates. It is an important randomness test included in some famous evaluation standards and statistical test suites such as Application Notes and Interpretation of the Scheme (AIS20), the Federal Information Processing Standards (FIPS140), CryptX, and so on. However, when it is applied on some well-known good Deterministic Random Bit Generators (DRBGs), the test results show apparent bias from randomness. This shows that there exist some inaccuracies in the runs distribution test. The problem is solved and the runs distribution test through two ways is corrected. First, the degree of freedom of statistical value V is adjusted. Secondly, the expected number of different lengths runs is modified. The experiment results show that the corrected runs distribution test is more accurate under two-level evaluation approach proposed by National Institute of Standards and Technology (NIST) Special Publication (SP) 800-22. |
| 英文摘要 | Runs distribution test is an important statistical test based on Golomb's randomness postulates. It is an important randomness test included in some famous evaluation standards and statistical test suites such as Application Notes and Interpretation of the Scheme (AIS20), the Federal Information Processing Standards (FIPS140), CryptX, and so on. However, when it is applied on some well-known good Deterministic Random Bit Generators (DRBGs), the test results show apparent bias from randomness. This shows that there exist some inaccuracies in the runs distribution test. The problem is solved and the runs distribution test through two ways is corrected. First, the degree of freedom of statistical value V is adjusted. Secondly, the expected number of different lengths runs is modified. The experiment results show that the corrected runs distribution test is more accurate under two-level evaluation approach proposed by National Institute of Standards and Technology (NIST) Special Publication (SP) 800-22. |
| 收录类别 | SCI |
| 语种 | 英语 |
| WOS记录号 | WOS:000369863000016 |
| 公开日期 | 2016-12-09 |
| 源URL | [http://ir.iscas.ac.cn/handle/311060/17349]  |
| 专题 | 软件研究所_软件所图书馆_期刊论文 |
| 推荐引用方式 GB/T 7714 | Fan, LM,Chen, H,Chen, MH,et al. Corrected runs distribution test for pseudorandom number generators[J]. ELECTRONICS LETTERS,2016,52(4):281-282. |
| APA | Fan, LM,Chen, H,Chen, MH,&Gao, S.(2016).Corrected runs distribution test for pseudorandom number generators.ELECTRONICS LETTERS,52(4),281-282. |
| MLA | Fan, LM,et al."Corrected runs distribution test for pseudorandom number generators".ELECTRONICS LETTERS 52.4(2016):281-282. |
入库方式： OAI收割
来源：软件研究所
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