virtual circuit model for low power scan testing in linear decompressor-based compression environment
文献类型：会议论文
| 作者 | Chen Zhen ; Li Jia ; Xiang Dong ; Huang Yu |
| 出版日期 | 2011 |
| 会议名称 | 20th Asian Test Symposium, ATS 2011 |
| 会议日期 | November 20, 2011 - November 23, 2011 |
| 会议地点 | New Delhi, India |
| 关键词 | Circuit theory Filling Low power electronics |
| 页码 | 96-101 |
| 中文摘要 | Large test data volume and high test power consumption are two major concerns for the industry when testing large integrated circuits. Linear decompress or-based compression (LDC) is efficient in reducing test data volume, while X-filling during ATPG can efficiently reduce test power with low overhead. However, traditional X-filling methods cannot be reused in the LDC environment. In this paper, we propose a virtual circuit model to make the linear de-compressor transparent to the external testing. As a result, existing X-filling methods can be reused to reduce test power. Experimental results on benchmark circuits demonstrate the effciency of the proposed approach. © 2011 IEEE. |
| 英文摘要 | Large test data volume and high test power consumption are two major concerns for the industry when testing large integrated circuits. Linear decompress or-based compression (LDC) is efficient in reducing test data volume, while X-filling during ATPG can efficiently reduce test power with low overhead. However, traditional X-filling methods cannot be reused in the LDC environment. In this paper, we propose a virtual circuit model to make the linear de-compressor transparent to the external testing. As a result, existing X-filling methods can be reused to reduce test power. Experimental results on benchmark circuits demonstrate the effciency of the proposed approach. © 2011 IEEE. |
| 收录类别 | EI |
| 会议主办者 | Indraprastha Institute of Information Technology (IIIT); VLSI Society of India |
| 会议录 | Proceedings of the Asian Test Symposium
 |
| 语种 | 英语 |
| ISSN号 | 1081-7735 |
| ISBN号 | 9780769545837 |
| 源URL | [http://ir.iscas.ac.cn/handle/311060/16314]  |
| 专题 | 软件研究所_软件所图书馆_会议论文 |
| 推荐引用方式 GB/T 7714 | Chen Zhen,Li Jia,Xiang Dong,et al. virtual circuit model for low power scan testing in linear decompressor-based compression environment[C]. 见:20th Asian Test Symposium, ATS 2011. New Delhi, India. November 20, 2011 - November 23, 2011. |
入库方式： OAI收割
来源：软件研究所
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