characterizing failure-causing parameter interactions by adaptive testing
文献类型：会议论文
| 作者 | Zhang Zhiqiang ; Zhang Jian |
| 出版日期 | 2011 |
| 会议名称 | 20th International Symposium on Software Testing and Analysis, ISSTA 2011 |
| 会议日期 | 17-Jul-02 |
| 会议地点 | Toronto, ON, Canada |
| 关键词 | Computer software selection and evaluation Fault detection Testing |
| 页码 | 331-341 |
| 英文摘要 | Combinatorial testing is a widely used black-box testing technique, which is used to detect failures caused by parameter interactions (we call them faulty interactions). Traditional combinatorial testing techniques provide fault detection, but most of them provide weak fault diagnosis. In this paper, we propose a new fault characterization method called faulty interaction characterization (FIC) and its binary search alternative FIC-BS to locate one failure-causing interaction in a single failing test case. In addition, we provide a tradeoff strategy of locating multiple faulty interactions in one test case. Our methods are based on adaptive black-box testing, in which test cases are generated based on outcomes of previous tests. For locating a t-way faulty interaction, the number of test cases used is at most k (for FIC) or t(⌈log2 k⌉+1)+1 (for FIC-BS), where k is the number of parameters. Simulation experiments show that our method needs smaller number of adaptive test cases than most existing methods for locating randomly-generated faulty interactions. Yet it has stronger or equivalent ability of locating faulty interactions. © 2011 ACM. |
| 收录类别 | EI |
| 会议主办者 | Assoc. Comput. Mach., Spec. Interest Group; Softw. Eng. (ACM SIGSOFT) |
| 会议录 | 2011 International Symposium on Software Testing and Analysis, ISSTA 2011 - Proceedings
 |
| 会议录出版地 | United States |
| ISBN号 | 9781450305624 |
| 源URL | [http://124.16.136.157/handle/311060/14251]  |
| 专题 | 软件研究所_计算机科学国家重点实验室 _会议论文 |
| 推荐引用方式 GB/T 7714 | Zhang Zhiqiang,Zhang Jian. characterizing failure-causing parameter interactions by adaptive testing[C]. 见:20th International Symposium on Software Testing and Analysis, ISSTA 2011. Toronto, ON, Canada. 17-Jul-02. |
入库方式： OAI收割
来源：软件研究所
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