A stratified sampling model in spherical feature inspection using coordinate measuring machines
文献类型：期刊论文
| 作者 | Fang, KT; Wang, SG; Wei, G |
| 刊名 | STATISTICS & PROBABILITY LETTERS
 |
| 出版日期 | 2001 |
| 卷号 | 51期号:1页码:25-34 |
| 关键词 | stratified sampling coordinate measuring machine computer aided design linear model random effect |
| ISSN号 | 0167-7152 |
| 英文摘要 | A coordinate measuring machine (CMM) is a computer-controlled device that uses a probe to obtain measurements on a manufactured part's surface. In the process of collecting, analyzing and interpreting CMM data, many statistical problems arise. One of them is to choose a model describing the relationship between the location and shape parameters of the part and CMM data and representing the effects of the various sources of randomness of these data. This article suggests a linear model for a stratified sampling scheme, which is one of the most commonly discussed in the CMM literature, in fitting a spherical surface. A feasible generalized least-squares estimator of the part's spherical parameter set is given and its property is studied. Our theoretical results indicate that stratified sampling performs better than random sampling. A similar conclusion was also obtained by Caskey et al. (1990, Design Manufacturing Systems Conf. 779-786) and Xu (1992, M.S. thesis, University of Texas - EI Paso, Mechanical and Industrial Engineering Department, unpublished) using the Monte Carlo experiments for some quite different situations. (C) 2001 Elsevier Science B.V. All rights reserved. |
| WOS研究方向 | Mathematics |
| 语种 | 英语 |
| WOS记录号 | WOS:000165893800004 |
| 出版者 | ELSEVIER SCIENCE BV |
| 源URL | [http://ir.amss.ac.cn/handle/2S8OKBNM/16045]  |
| 专题 | 中国科学院数学与系统科学研究院 |
| 作者单位 | 1.Hong Kong Baptist Univ, Dept Math, Kowloon, Hong Kong, Peoples R China 2.Acad Sinica, Inst Appl Math, Beijing 100080, Peoples R China 3.Beijing Polytech Univ, Dept Appl Math, Beijing 100022, Peoples R China |
| 推荐引用方式 GB/T 7714 | Fang, KT,Wang, SG,Wei, G. A stratified sampling model in spherical feature inspection using coordinate measuring machines[J]. STATISTICS & PROBABILITY LETTERS,2001,51(1):25-34. |
| APA | Fang, KT,Wang, SG,&Wei, G.(2001).A stratified sampling model in spherical feature inspection using coordinate measuring machines.STATISTICS & PROBABILITY LETTERS,51(1),25-34. |
| MLA | Fang, KT,et al."A stratified sampling model in spherical feature inspection using coordinate measuring machines".STATISTICS & PROBABILITY LETTERS 51.1(2001):25-34. |
入库方式： OAI收割
来源：数学与系统科学研究院
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