中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
On the relaxation limits of the hydrodynamic model for semiconductor devices

文献类型:期刊论文

作者Qiu, YC; Zhang, KJ
刊名MATHEMATICAL MODELS & METHODS IN APPLIED SCIENCES
出版日期2002-03-01
卷号12期号:3页码:333-363
关键词global weak solution trace of weak solution relaxation limit compensated compactness Godunov scheme semiconductor hydrodynamic model
ISSN号0218-2025
英文摘要The initial-boundary value problem of a simplified one-dimensional hydrodynamic model for semiconductors is considered. The global weak solution and its relaxation limit are obtained through using the compensated compactness methods. The traces of weak solutions axe also discussed.
WOS研究方向Mathematics
语种英语
WOS记录号WOS:000174918900002
出版者WORLD SCIENTIFIC PUBL CO PTE LTD
源URL[http://ir.amss.ac.cn/handle/2S8OKBNM/16941]  
专题中国科学院数学与系统科学研究院
通讯作者Qiu, YC
作者单位1.Univ Toulouse 3, CNRS, UMR 5640, MIP, F-31062 Toulouse 04, France
2.Acad Sinica, Inst Math, Beijing 100080, Peoples R China
推荐引用方式
GB/T 7714
Qiu, YC,Zhang, KJ. On the relaxation limits of the hydrodynamic model for semiconductor devices[J]. MATHEMATICAL MODELS & METHODS IN APPLIED SCIENCES,2002,12(3):333-363.
APA Qiu, YC,&Zhang, KJ.(2002).On the relaxation limits of the hydrodynamic model for semiconductor devices.MATHEMATICAL MODELS & METHODS IN APPLIED SCIENCES,12(3),333-363.
MLA Qiu, YC,et al."On the relaxation limits of the hydrodynamic model for semiconductor devices".MATHEMATICAL MODELS & METHODS IN APPLIED SCIENCES 12.3(2002):333-363.

入库方式: OAI收割

来源:数学与系统科学研究院

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