中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Mechanism for an enhanced resistive switching effect of bilayer NiOx/TiO2 for resistive random access memory

文献类型:期刊论文

作者Zhou,Guangdong; Xiao,Lihua; Zhang,Shuangju; Wu,Bo; Liu,Xiaoqin; Zhou,Ankun
刊名JOURNAL OF ALLOYS AND COMPOUNDS
出版日期2017
卷号722页码:753-759
关键词Electric-field Devices Bipolar Films Heterostructures Transition Behaviors Filament Matrix Cells Bilay Niox/tio2 Films Resistive Switching Memory Migration Of Oxygen Vacancy Ag Conduction Filamens
ISSN号0925-8388
DOI10.1016/j.jallcom.2017.06.178
英文摘要Bilayer of NiOx/TiO2 thin film spin-coated and sputtering-deposited on the fluorine doped tin oxide (FTO) substrate is employed to develop a resistive random access memory device. An enhanced resistive switching (RS) behavior, which with appropriate resistance ratio of similar to 10(3), switching cycle endurance for 10(2) and long retention time for 10(4) s, is observed in the bilayer NiOx/TiO2 based device. Construction of contact-potential barrier, formation and rupture of a localized conduction filaments and migration of oxygen vacancy existed in the interface near electrodes co-contribute to the enhanced RS memory effects, but the migration of Ag+, Ni2x+ and diffusion of oxygen vacancies are the dominated ones. This work might give an insight into the mechanism of RS memory behaviors of an oxide-stacked structure device. (C) 2017 Published by Elsevier B.V.
学科主题Chemistry, Physical ; Materials Science, Multidisciplinary ; Metallurgy & Metallurgical Engineering
语种英语
源URL[http://ir.kib.ac.cn/handle/151853/54868]  
专题昆明植物研究所_植物化学与西部植物资源持续利用国家重点实验室
推荐引用方式
GB/T 7714
Zhou,Guangdong,Xiao,Lihua,Zhang,Shuangju,et al. Mechanism for an enhanced resistive switching effect of bilayer NiOx/TiO2 for resistive random access memory[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2017,722:753-759.
APA Zhou,Guangdong,Xiao,Lihua,Zhang,Shuangju,Wu,Bo,Liu,Xiaoqin,&Zhou,Ankun.(2017).Mechanism for an enhanced resistive switching effect of bilayer NiOx/TiO2 for resistive random access memory.JOURNAL OF ALLOYS AND COMPOUNDS,722,753-759.
MLA Zhou,Guangdong,et al."Mechanism for an enhanced resistive switching effect of bilayer NiOx/TiO2 for resistive random access memory".JOURNAL OF ALLOYS AND COMPOUNDS 722(2017):753-759.

入库方式: OAI收割

来源:昆明植物研究所

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