Using temperature-switching approach to evaluate the ELDRS of bipolar devices
文献类型：期刊论文
| 作者 | Li, XL (Li, Xiaolong); Lu, W (Lu, Wu) ; Wang, X (Wang, Xin); Guo, Q (Guo, Qi); Yu, X (Yu, Xin); He, CF (He, Chengfa); Sun, J (Sun, Jing); Liu, MH (Liu, Mohan); Yao, S (Yao, Shuai); Wei, XY (Wei, Xinyu)查看 ResearcherID 和 ORCID
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| 刊名 | RADIATION EFFECTS AND DEFECTS IN SOLIDS
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| 出版日期 | 2018 |
| 卷号 | 172期号:11-12页码:824-834 |
| 关键词 | Bipolar Technology Co-60 Gamma Irradiation Enhanced Low-dose Rate Sensitivity (Eldrs) Temperature-switching Approach (Tsa) |
| ISSN号 | 1042-0150 |
| DOI | 10.1080/10420150.2017.1411354 |
| 英文摘要 | Enhanced low-dose rate sensitivity (ELDRS) exhibited at low-dose rates (LDRs) by most bipolar devices is considered as one of the main concerns for spacecraft reliability. In this work, a time-saving and conservative approach - temperature-switching approach (TSA) - to simulate the ELDRS of bipolar devices is presented. Good agreement is observed between the predictive curve obtained with the TSA and the LDR data, and TSA provides us with a new insight into the test technique for ELDRS. Additionally, the mechanisms of TSA are analyzed in this paper. |
| WOS记录号 | WOS:000423771100003 |
| 源URL | [http://ir.xjipc.cas.cn/handle/365002/5501]  |
| 专题 | 新疆理化技术研究所_中国科学院特殊环境功能材料与器件重点试验室 新疆理化技术研究所_材料物理与化学研究室 |
| 通讯作者 | Lu, W (Lu, Wu) |
| 作者单位 | 1.Chinese Acad Sci, Key Lab Funct Mat & Devices Special Environm, Urumqi, Peoples R China 2.Xinjiang Tech Inst Phys & Chem, Xinjiang Key Lab Elect Informat Mat & Device, Urumqi, Peoples R China 3.Univ Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Beijing, Peoples R China |
| 推荐引用方式 GB/T 7714 | Li, XL ,Lu, W ,Wang, X ,et al. Using temperature-switching approach to evaluate the ELDRS of bipolar devices[J]. RADIATION EFFECTS AND DEFECTS IN SOLIDS,2018,172(11-12):824-834. |
| APA | Li, XL .,Lu, W .,Wang, X .,Guo, Q .,Yu, X .,...&Wei, XY .(2018).Using temperature-switching approach to evaluate the ELDRS of bipolar devices.RADIATION EFFECTS AND DEFECTS IN SOLIDS,172(11-12),824-834. |
| MLA | Li, XL ,et al."Using temperature-switching approach to evaluate the ELDRS of bipolar devices".RADIATION EFFECTS AND DEFECTS IN SOLIDS 172.11-12(2018):824-834. |
入库方式： OAI收割
来源：新疆理化技术研究所
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