Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods
文献类型：期刊论文
| 作者 | Zhang, L; Song, SN; Xi, W; Li, L; Song, ZT |
| 刊名 | JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
 |
| 出版日期 | 2018 |
| 卷号 | 29期号:6页码:4704-4710 |
| 关键词 | Crystallization Behavior Raman-scattering |
| ISSN号 | 0957-4522 |
| DOI | 10.1007/s10854-017-8422-0 |
| 文献子类 | 期刊论文 |
| 英文摘要 | Influence of Ti additions in Sb2Te3 thin films on structure and phase stability was studied by experiments together with theoretical calculations. The incorporation of Ti atoms in the Sb2Te3 thin films caused formation of finer grains. By X-ray photoelectron spectroscopy and ab initio calculation, both the Sb and Te atoms are likely to be replaced by the Ti atoms to form Ti-Sb and Ti-Te covalent bonds. It suggests that the Ti atoms locate in Te1 position and interstice of the lattice. |
| 语种 | 英语 |
| WOS记录号 | WOS:000425763100038 |
| 源URL | [http://ir.sinap.ac.cn/handle/331007/28983]  |
| 专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
| 作者单位 | 1.Zhang, L 2.Song, SN 3.Xi, W 4.Li, L 5.Song, ZT |
| 推荐引用方式 GB/T 7714 | Zhang, L,Song, SN,Xi, W,et al. Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods[J]. JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,2018,29(6):4704-4710. |
| APA | Zhang, L,Song, SN,Xi, W,Li, L,&Song, ZT.(2018).Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods.JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS,29(6),4704-4710. |
| MLA | Zhang, L,et al."Effect of Ti additions on structure and phase stability of Sb2Te3 thin films by experimental and theoretical methods".JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS 29.6(2018):4704-4710. |
入库方式： OAI收割
来源：上海应用物理研究所
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