Nanoscale mapping of dielectric properties based on surface adhesion force measurements
文献类型：期刊论文
| 作者 | Wang, Y; Shen, Y; Wang, XY; Shen, ZW; Li, B; Hui, J; Zhang, Y |
| 刊名 | BEILSTEIN JOURNAL OF NANOTECHNOLOGY
 |
| 出版日期 | 2018 |
| 卷号 | 9页码:900-906 |
| 关键词 | Scanning Probe Microscopy Graphene Oxide Sheets Large Energy Density Polymer Nanocomposites Graphite Oxide Composites Constant Membranes Films |
| ISSN号 | 2190-4286 |
| DOI | 10.3762/bjnano.9.84 |
| 文献子类 | 期刊论文 |
| 英文摘要 | The detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. Through direct imaging of the samples with a biased AFM tip in PeakForce Quantitative Nano-Mechanics (PF-QNM) mode, the local dielectric properties of GO and RGO were revealed by mapping their surface adhesion forces. Thus, GO and RGO could be conveniently differentiated. This method provides a simple and general approach for the fast characterization of the local dielectric properties of graphene-based materials and will further facilitate their applications in energy generation and storage devices. |
| 语种 | 英语 |
| WOS记录号 | WOS:000428094400001 |
| 源URL | [http://ir.sinap.ac.cn/handle/331007/29082]  |
| 专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
| 作者单位 | 1.Wang, Y 2.Shen, Y 3.Wang, XY 4.Shen, ZW 5.Li, B 6.Hui, J 7.Zhang, Y |
| 推荐引用方式 GB/T 7714 | Wang, Y,Shen, Y,Wang, XY,et al. Nanoscale mapping of dielectric properties based on surface adhesion force measurements[J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY,2018,9:900-906. |
| APA | Wang, Y.,Shen, Y.,Wang, XY.,Shen, ZW.,Li, B.,...&Zhang, Y.(2018).Nanoscale mapping of dielectric properties based on surface adhesion force measurements.BEILSTEIN JOURNAL OF NANOTECHNOLOGY,9,900-906. |
| MLA | Wang, Y,et al."Nanoscale mapping of dielectric properties based on surface adhesion force measurements".BEILSTEIN JOURNAL OF NANOTECHNOLOGY 9(2018):900-906. |
入库方式： OAI收割
来源：上海应用物理研究所
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