Determination of cut-off time of accelerated aging test under temperature stress for LED lamps
文献类型：期刊论文
| 作者 | Hao, J.; L. Jing; H. L. Ke; Y. Wang; Q. Gao; X. X. Wang; Q. Sun and Z. J. Xu |
| 刊名 | Frontiers of Information Technology & Electronic Engineering
 |
| 出版日期 | 2017 |
| 卷号 | 18期号:8 |
| 英文摘要 | To acquire a rational minimum cut-off time and the precision of lifetime prediction with respect to cut-off time for the accelerated aging test of LED lamps, fifth-order moving average error estimation is adopted in this paper. Eighteen LED lamps from the same batch are selected for two accelerated aging tests, with 10 samples at 80 A degrees C and eight samples at 85 A degrees C. First, the accelerated lifetime of each lamp is acquired by exponential fitting of the lumen maintenances of the lamp for a certain cut-off time. With the acquired lifetimes of all lamps, the two-parameter Weibull distribution of the failure probability is obtained, and the medium lifetime is calculated. Then, the precision of the medium lifetime prediction for different cut-off times is obtained by moving average error estimation. It is shown that there exists a minimum cut-off time for the accelerated aging test, which can be determined by the variation of the moving average error versus the cut-off time. When the cut-off time is less than this value, the lifetime estimation is irrational. For a given cut-off time, the precision of lifetime prediction can be computed by average error evaluation, and the error of lifetime estimation decreases gradually as the cut-off time increases. The minimum cut-off time and medium lifetime of LED lamps are both sensitive to thermal stress. The minimum cut-off time is 1104 h with the lifetime estimation error of 1.15% for the test at 80 A degrees C, and 936 h with the lifetime estimation error of 1.24% for the test at 85 A degrees C. With the lifetime estimation error of about 0.46%, the median lifetimes are 7310 h and 4598 h for the tests at 80 A degrees C and 85A degrees C, respectively. |
| 语种 | 英语 |
| 源URL | [http://ir.ciomp.ac.cn/handle/181722/58929]  |
| 专题 | 长春光学精密机械与物理研究所_中科院长春光机所知识产出 |
| 推荐引用方式 GB/T 7714 | Hao, J.,L. Jing,H. L. Ke,et al. Determination of cut-off time of accelerated aging test under temperature stress for LED lamps[J]. Frontiers of Information Technology & Electronic Engineering,2017,18(8). |
| APA | Hao, J..,L. Jing.,H. L. Ke.,Y. Wang.,Q. Gao.,...&Q. Sun and Z. J. Xu.(2017).Determination of cut-off time of accelerated aging test under temperature stress for LED lamps.Frontiers of Information Technology & Electronic Engineering,18(8). |
| MLA | Hao, J.,et al."Determination of cut-off time of accelerated aging test under temperature stress for LED lamps".Frontiers of Information Technology & Electronic Engineering 18.8(2017). |
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