Identifying Single Event Transients Location based on Compressed Sensing
文献类型：期刊论文
| 作者 | Cuiping Shao; Huiyun Li |
| 刊名 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
 |
| 出版日期 | 2017 |
| 文献子类 | 期刊论文 |
| 英文摘要 | Single event transients (SETs) have seriously deteriorated the reliability of integrated circuits (ICs), especially for those in mission- or security-critical applications. Detecting and locating SETs can be useful for fault analysis and design enhancement. Traditional methods of location identification of SETs s usually require special sensors embedded into the circuits, or radiation scanning with fine resolutions over the surface for inspection. In this paper, we propose a method of location identification of SETs without sensors or image processing. We formulate location identification of SETs as a compressed sensing problem due to the sparsity and non-coherence observation. The simulation result on a cryptographic IC is demonstrated. The results illustrate that the proposed method has three advantages, compared to traditional SETs test methods: 1) the SETs sensitive area can be accurately identified. 2) The sampling rate is reduced by 64%, therefore the test efficiency is largely enhanced with negligible hardware overhead. 3) The method of location identification of SETs is robust to noise interference. |
| URL标识 | 查看原文 |
| 语种 | 英语 |
| 源URL | [http://ir.siat.ac.cn:8080/handle/172644/11582]  |
| 专题 | 深圳先进技术研究院_集成所 |
| 作者单位 | IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS |
| 推荐引用方式 GB/T 7714 | Cuiping Shao,Huiyun Li. Identifying Single Event Transients Location based on Compressed Sensing[J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS,2017. |
| APA | Cuiping Shao,&Huiyun Li.(2017).Identifying Single Event Transients Location based on Compressed Sensing.IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. |
| MLA | Cuiping Shao,et al."Identifying Single Event Transients Location based on Compressed Sensing".IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS (2017). |
入库方式： OAI收割
来源：深圳先进技术研究院
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