Detection of Single Event Transients based on Compressed Sensing
文献类型：会议论文
| 作者 | Cuiping Shao ; Huiyun Li |
| 出版日期 | 2017 |
| 会议地点 | Australia |
| 英文摘要 | Single event transients (SETs) have seriously deteriorated the reliability Integrated circuits (ICs), especially for those in mission- or security-critical applications. Detecting and locating SETs can be useful for fault analysis and future enhancement. Traditional SET detecting methods usually require special sensors embedded into the circuits, or radiation scanning with fine resolutions over the surface for inspection. In this paper, we establish the relationship between sparsity of SETs and the overall faults. Then we develop the method of compressed sensing to detect the location of SET in ICs, without any embed sensors or imaging procession. A case study on a cryptographic IC by logic simulation is demonstrated. It verifies that the proposed method has two main advantages: 1) the SET sensitive area can be accurately identified. 2) The sampling rate is reduced by 70%, therefore the test efficiency is largely enhanced with negligible hardware overhead. |
| 语种 | 英语 |
| 源URL | [http://ir.siat.ac.cn:8080/handle/172644/11782]  |
| 专题 | 深圳先进技术研究院_集成所 |
| 作者单位 | 2017 |
| 推荐引用方式 GB/T 7714 | Cuiping Shao , Huiyun Li. Detection of Single Event Transients based on Compressed Sensing[C]. 见:. Australia. |
入库方式： OAI收割
来源：深圳先进技术研究院
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