Measurement of Heating Rates in a Microscopic Surface-Electrode Ion Trap
文献类型:期刊论文
作者 | Yan, Lei-Lei1,2; He, Jiu-Zhou1,2; Feng, Mang2; Li, Ji1,2; Chen, Liang2 |
刊名 | CHINESE PHYSICS LETTERS
![]() |
出版日期 | 2017-06-01 |
卷号 | 34期号:6 |
DOI | 10.1088/0256-307X/34/6/063701 |
文献子类 | Article |
英文摘要 | We report measurement of heating rates of Ca-40(+) ions confined in our home-made microscopic surface-electrode trap by a Doppler recooling method. The ions are trapped with approximately 800 mu m above the surface, and are subjected to heating due to various noises in the trap. There are 3-5 ions involved to measure the heating rates precisely and efficiently. We show the heating rates in variance with the number and the position of the ions as well as the radio-frequency power, which are helpful for understanding the trap imperfection. |
WOS研究方向 | Physics |
语种 | 英语 |
WOS记录号 | WOS:000403271700010 |
资助机构 | National Natural Science Foundation of China(Y5Z2111001 ; National Natural Science Foundation of China(Y5Z2111001 ; 91421111 ; 91421111 ; 11674360) ; 11674360) ; National Natural Science Foundation of China(Y5Z2111001 ; National Natural Science Foundation of China(Y5Z2111001 ; 91421111 ; 91421111 ; 11674360) ; 11674360) |
源URL | [http://ir.wipm.ac.cn/handle/112942/11494] ![]() |
专题 | 武汉物理与数学研究所_原子分子光物理研究部 |
作者单位 | 1.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 2.Chinese Acad Sci, State Key Lab Magnet Resonance & Atom & Mol Phys, Wuhan Inst Phys & Math, Wuhan 430071, Peoples R China |
推荐引用方式 GB/T 7714 | Yan, Lei-Lei,He, Jiu-Zhou,Feng, Mang,et al. Measurement of Heating Rates in a Microscopic Surface-Electrode Ion Trap[J]. CHINESE PHYSICS LETTERS,2017,34(6). |
APA | Yan, Lei-Lei,He, Jiu-Zhou,Feng, Mang,Li, Ji,&Chen, Liang.(2017).Measurement of Heating Rates in a Microscopic Surface-Electrode Ion Trap.CHINESE PHYSICS LETTERS,34(6). |
MLA | Yan, Lei-Lei,et al."Measurement of Heating Rates in a Microscopic Surface-Electrode Ion Trap".CHINESE PHYSICS LETTERS 34.6(2017). |
入库方式: OAI收割
来源:武汉物理与数学研究所
浏览0
下载0
收藏0
其他版本
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。