Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope
文献类型：期刊论文
| 作者 | Huang, Shihong1; Zhu, Tao1; Cao, Zhenzhou2; Liu, Min1; Deng, Ming1; Liu, Jianguo3; Li, Xiong4 |
| 刊名 | IEEE Photonics Technology Letters
 |
| 出版日期 | 2016 |
| 卷号 | 28期号:7页码:759-762 |
| 关键词 | Heterodyning Interferometers |
| ISSN号 | 1041-1135 |
| DOI | 10.1109/LPT.2015.2513098 |
| 文献子类 | J |
| 英文摘要 | We present an amplitude difference comparison of coherent envelope method for accurately measuring the laser linewidth. The new method of comparing the contrast difference of the second peak and trough of coherent envelope to determine the laser linewidth is proved to be stable and has little error. The feasibility and the accuracy of the method have been confirmed theoretically and experimentally. Our method based on short delayed self-heterodyne interferometer can almost ignore the influence of the broadening spectrum induced by the 1/f frequency noise. Therefore, the method has the advantage of accurate detection for narrow or ultra-narrow linewidth. © 2016 IEEE. |
| 语种 | 英语 |
| 源URL | [http://ir.ioe.ac.cn/handle/181551/8472]  |
| 专题 | 光电技术研究所_微细加工光学技术国家重点实验室（开放室） |
| 作者单位 | 1.Key Laboratory of Optoelectronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing, China 2.College of Electronics and Information, South-Central University for Nationalities, Wuhan, China 3.State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, China 4.State Key Laboratory of Optical Technologies on Micro-Engineering and Nano-Fabrication, Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, China |
| 推荐引用方式 GB/T 7714 | Huang, Shihong,Zhu, Tao,Cao, Zhenzhou,et al. Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope[J]. IEEE Photonics Technology Letters,2016,28(7):759-762. |
| APA | Huang, Shihong.,Zhu, Tao.,Cao, Zhenzhou.,Liu, Min.,Deng, Ming.,...&Li, Xiong.(2016).Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope.IEEE Photonics Technology Letters,28(7),759-762. |
| MLA | Huang, Shihong,et al."Laser Linewidth Measurement Based on Amplitude Difference Comparison of Coherent Envelope".IEEE Photonics Technology Letters 28.7(2016):759-762. |
入库方式： OAI收割
来源：光电技术研究所
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