Object detection based on deformable part model
文献类型：期刊论文
| 作者 | Wei, Lei1,2; Xu, Zhiyong1 |
| 刊名 | Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment
 |
| 出版日期 | 2016 |
| 卷号 | 9684页码:96842P |
| 关键词 | Feature Extraction Manufacture Object Detection Optical Testing Principal Component Analysis Support Vector Machines |
| ISSN号 | 0277-786X |
| DOI | 10.1117/12.2243219 |
| 文献子类 | C |
| 英文摘要 | In complex scene, considering traditional object detection methods based on feature points have exposed many problems, such as undetected points, low detected ratio and cannot well process object occlusion and scaling situation, this paper proposes a detection method which based on a deformable part model. The method uses histogram of oriented gradient (HOG) feature as the object description, and the deformable part model includes a global template and several high-resolution templates. And the method uses the support vector machine (SVM) training the object model. In the learning process, after the HOG feature extracted, the method modifies the HOG feature, and then uses the principal component analysis (PCA) method reducing feature dimensions to avoid over-learning, and improve the detection rate in the detection process. The experiment results shows that the method proposed can better process object occlusion or scaled situation, and there's also an improvement in detection ratio. © 2016 SPIE. |
| 语种 | 英语 |
| WOS记录号 | WOS:000387429500097 |
| 资助机构 | Chinese Academy of Sciences, Institute of Optics and Electronics (IOE) ; The Chinese Optical Society (COS) |
| 源URL | [http://ir.ioe.ac.cn/handle/181551/8516]  |
| 专题 | 光电技术研究所_光电探测与信号处理研究室（五室） |
| 作者单位 | 1.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 2.610209, China 3.University of Chinese Academy of Sciences, Beijing 4.100039, China |
| 推荐引用方式 GB/T 7714 | Wei, Lei,Xu, Zhiyong. Object detection based on deformable part model[J]. Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment,2016,9684:96842P. |
| APA | Wei, Lei,&Xu, Zhiyong.(2016).Object detection based on deformable part model.Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment,9684,96842P. |
| MLA | Wei, Lei,et al."Object detection based on deformable part model".Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technology: Optical Test, Measurement Technology, and Equipment 9684(2016):96842P. |
入库方式： OAI收割
来源：光电技术研究所
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