Design of efficient and simple interface testing equipment for opto-electric tracking system
文献类型：期刊论文
| 作者 | Liu, Qiong1,2; Deng, Chao1,2,3; Tian, Jing1,2; Mao, Yao1,2 |
| 刊名 | Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes
 |
| 出版日期 | 2016 |
| 卷号 | 9682页码:968212 |
| 关键词 | Automatic Programming Codes (Symbols) Computer Software Selection And Evaluation Efficiency Electric Variables Measurement Equipment Hardware Manufacture Mirrors Optical Testing Program Processors Telescopes Tracking (Position) |
| ISSN号 | 0277-786X |
| DOI | 10.1117/12.2243951 |
| 文献子类 | C |
| 英文摘要 | Interface testing for opto-electric tracking system is one important work to assure system running performance, aiming to verify the design result of every electronic interface matching the communication protocols or not, by different levels. Opto-electric tracking system nowadays is more complicated, composed of many functional units. Usually, interface testing is executed between units manufactured completely, highly depending on unit design and manufacture progress as well as relative people. As a result, it always takes days or weeks, inefficiently. To solve the problem, this paper promotes an efficient and simple interface testing equipment for opto-electric tracking system, consisting of optional interface circuit card, processor and test program. The hardware cards provide matched hardware interface(s), easily offered from hardware engineer. Automatic code generation technique is imported, providing adaption to new communication protocols. Automatic acquiring items, automatic constructing code architecture and automatic encoding are used to form a new program quickly with adaption. After simple steps, a standard customized new interface testing equipment with matching test program and interface(s) is ready for a waiting-test system in minutes. The efficient and simple interface testing equipment for opto-electric tracking system has worked for many opto-electric tracking system to test entire or part interfaces, reducing test time from days to hours, greatly improving test efficiency, with high software quality and stability, without manual coding. Used as a common tool, the efficient and simple interface testing equipment for opto-electric tracking system promoted by this paper has changed traditional interface testing method and created much higher efficiency. © 2016 SPIE. |
| 语种 | 英语 |
| WOS记录号 | WOS:000387746500037 |
| 资助机构 | Chinese Academy of Sciences, Institute of Optics and Electronics (IOE) ; The Chinese Optical Society (COS) |
| 源URL | [http://ir.ioe.ac.cn/handle/181551/8545]  |
| 专题 | 光电技术研究所_光电工程总体研究室（一室） |
| 作者单位 | 1.Institute of Optics and Electronics, Chinese Academy of Science, Chengdu 2.610209, China 3.Key Laboratory of Optical Engineering, Chinese Academy of Sciences, Chengdu 4.610209, China 5.University of Chinese Academy of Sciences, Beijing 6.100039, China |
| 推荐引用方式 GB/T 7714 | Liu, Qiong,Deng, Chao,Tian, Jing,et al. Design of efficient and simple interface testing equipment for opto-electric tracking system[J]. Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes,2016,9682:968212. |
| APA | Liu, Qiong,Deng, Chao,Tian, Jing,&Mao, Yao.(2016).Design of efficient and simple interface testing equipment for opto-electric tracking system.Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes,9682,968212. |
| MLA | Liu, Qiong,et al."Design of efficient and simple interface testing equipment for opto-electric tracking system".Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes 9682(2016):968212. |
入库方式： OAI收割
来源：光电技术研究所
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