中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Scratch detection in metal surface by blasting using Gabor filters

文献类型:期刊论文

作者Liu, Shuangchun1,2; Jing, Hongwei1
刊名Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices
出版日期2016
卷号9686页码:96860W
关键词Bandpass Filters Blasting Edge Detection Frequency Domain Analysis Image Processing Manufacture Materials Testing Morphology Optoelectronic Devices Surface Defects
ISSN号0277-786X
DOI10.1117/12.2243220
文献子类C
英文摘要Sand blasting process can produce fine random concave and convex surfaces on the surface of the workpiece, which make the collected image background of the workpiece complex and the defects difficult to detect. Especially for the detection of low-contrast scratches, scratch depth is less than the depth of sand blasting surface. Common edge detection methods and threshold segmentation methods are difficult to effectively extract the scratch defect. According to the vertical characteristics of scratches direction in the spatial domain and the spatial-frequency domain, a method based on Gabor filter is proposed for the detection of scratch defect. Firstly, 36 Gabor filters with different directions are used to extract the directional feature of the image. Then, using the gray threshold method to segment the scratch regions in 36 different directions and merge the scratch regions. Finally, the morphological processing is used to remove the noise interference and connect the scratch regions which are not continuous. The experimental results show that the method is feasible and robust. Compared with the hysteresis threshold algorithm, the algorithm extracts the edge of the scratch without burr and has high precision. © 2016 SPIE.
语种英语
WOS记录号WOS:000391495500030
资助机构Chinese Academy of Sciences, Institute of Optics and Electronics (IOE) ; The Chinese Optical Society (COS)
源URL[http://ir.ioe.ac.cn/handle/181551/8563]  
专题光电技术研究所_质量处(质检中心)
作者单位1.Institute of Optics and Electronics, Chinese Academy of Sciences, P.O .Box 350, Chengdu
2.610209, China
3.University of Chinese Academy of Sciences, Beijing
4.100049, China
推荐引用方式
GB/T 7714
Liu, Shuangchun,Jing, Hongwei. Scratch detection in metal surface by blasting using Gabor filters[J]. Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices,2016,9686:96860W.
APA Liu, Shuangchun,&Jing, Hongwei.(2016).Scratch detection in metal surface by blasting using Gabor filters.Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices,9686,96860W.
MLA Liu, Shuangchun,et al."Scratch detection in metal surface by blasting using Gabor filters".Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices 9686(2016):96860W.

入库方式: OAI收割

来源:光电技术研究所

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