Scratch detection in metal surface by blasting using Gabor filters
文献类型:期刊论文
作者 | Liu, Shuangchun1,2; Jing, Hongwei1 |
刊名 | Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices
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出版日期 | 2016 |
卷号 | 9686页码:96860W |
关键词 | Bandpass Filters Blasting Edge Detection Frequency Domain Analysis Image Processing Manufacture Materials Testing Morphology Optoelectronic Devices Surface Defects |
ISSN号 | 0277-786X |
DOI | 10.1117/12.2243220 |
文献子类 | C |
英文摘要 | Sand blasting process can produce fine random concave and convex surfaces on the surface of the workpiece, which make the collected image background of the workpiece complex and the defects difficult to detect. Especially for the detection of low-contrast scratches, scratch depth is less than the depth of sand blasting surface. Common edge detection methods and threshold segmentation methods are difficult to effectively extract the scratch defect. According to the vertical characteristics of scratches direction in the spatial domain and the spatial-frequency domain, a method based on Gabor filter is proposed for the detection of scratch defect. Firstly, 36 Gabor filters with different directions are used to extract the directional feature of the image. Then, using the gray threshold method to segment the scratch regions in 36 different directions and merge the scratch regions. Finally, the morphological processing is used to remove the noise interference and connect the scratch regions which are not continuous. The experimental results show that the method is feasible and robust. Compared with the hysteresis threshold algorithm, the algorithm extracts the edge of the scratch without burr and has high precision. © 2016 SPIE. |
语种 | 英语 |
WOS记录号 | WOS:000391495500030 |
资助机构 | Chinese Academy of Sciences, Institute of Optics and Electronics (IOE) ; The Chinese Optical Society (COS) |
源URL | [http://ir.ioe.ac.cn/handle/181551/8563] ![]() |
专题 | 光电技术研究所_质量处(质检中心) |
作者单位 | 1.Institute of Optics and Electronics, Chinese Academy of Sciences, P.O .Box 350, Chengdu 2.610209, China 3.University of Chinese Academy of Sciences, Beijing 4.100049, China |
推荐引用方式 GB/T 7714 | Liu, Shuangchun,Jing, Hongwei. Scratch detection in metal surface by blasting using Gabor filters[J]. Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices,2016,9686:96860W. |
APA | Liu, Shuangchun,&Jing, Hongwei.(2016).Scratch detection in metal surface by blasting using Gabor filters.Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices,9686,96860W. |
MLA | Liu, Shuangchun,et al."Scratch detection in metal surface by blasting using Gabor filters".Proceedings of SPIE: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices 9686(2016):96860W. |
入库方式: OAI收割
来源:光电技术研究所
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