中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Optic flaws detection and location based on a plenoptic camera

文献类型:期刊论文

作者Luan, Yinsen1,2,3; Xu, Bing1,2; Yang, Ping1,2; Tang, Guomao1,2
刊名Chinese Optics Letters
出版日期2017
卷号15期号:4页码:041102
关键词Inspection - Location
ISSN号1671-7694
英文摘要In this Letter, we propose an on-line inspection method based on a plenoptic camera to detect and locate flaws of optics. Specifically, due to the extended depth of field of the plenoptic camera, a series of optics can be inspected efficiently and simultaneously. Moreover, the depth estimation capability of the plenoptic camera allows for locating flaws while detecting them. Besides, the detection and location can be implemented with a single snapshot of the plenoptic camera. Consequently, this method provides us with the opportunity to reduce the cost of time and labor of inspection and remove the flaw optics, which may lead to performance degradation of optical systems. © 2017 Chinese Optics Letters.
语种英语
源URL[http://ir.ioe.ac.cn/handle/181551/8791]  
专题光电技术研究所_自适应光学技术研究室(八室)
作者单位1.Key Laboratory on Adaptive Optics, Chinese Academy of Sciences, Chengdu; 610209, China;
2.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu; 610209, China;
3.University of the Chinese Academy of Sciences, Beijing; 100049, China
推荐引用方式
GB/T 7714
Luan, Yinsen,Xu, Bing,Yang, Ping,et al. Optic flaws detection and location based on a plenoptic camera[J]. Chinese Optics Letters,2017,15(4):041102.
APA Luan, Yinsen,Xu, Bing,Yang, Ping,&Tang, Guomao.(2017).Optic flaws detection and location based on a plenoptic camera.Chinese Optics Letters,15(4),041102.
MLA Luan, Yinsen,et al."Optic flaws detection and location based on a plenoptic camera".Chinese Optics Letters 15.4(2017):041102.

入库方式: OAI收割

来源:光电技术研究所

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