中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films

文献类型:期刊论文

作者Zhang Y(张吟); Gao FF(高斐斐); Zheng ZY; Cheng ZH
刊名ACTA MECHANICA SINICA
出版日期2018-12-01
卷号34期号:6页码:1061-1071
ISSN号0567-7718
关键词Indentation test Film Substrate Inverse problem
DOI10.1007/s10409-018-0778-8
英文摘要

In an indentation test, the effective Young's modulus of a film/substrate bilayer heterostructure varies with the indentation depth, a phenomenon known as the substrate effect. In previous studies investigating this, only the Young's modulus of the film was unknown. Once the effective Young's modulus of a film/substrate structure is determined at a given contact depth, the Young's modulus of the film can be uniquely determined, i.e., there is a one-to-one relation between the Young's modulus of the film and the film/substrate effective Young's modulus. However, at times it is extremely challenging or even impossible to measure the film thickness. Furthermore, the precise definition of the layer/film thickness for a two-dimensional material can be problematic. In the current study, therefore, the thickness of the film and its Young's modulus are treated as two unknowns that must be determined. Unlike the case with one unknown, there are infinite combinations of film thickness and Young's modulus which can yield the same effective Young's modulus for the film/substrate. An inverse problem is formulated and solved to extract the Young's modulus and thickness of the film from the indentation depth-load curve. The accuracy and robustness of the inverse problem-solving method are also demonstrated.

分类号二类
URL标识查看原文
WOS关键词ELASTIC-MODULUS ; MECHANICAL-PROPERTIES ; ADHESION MAP ; THIN-LAYERS ; CONTACT ; SUBSTRATE ; HARDNESS ; STIFFNESS ; FRICTION ; GRAPHENE
WOS研究方向Engineering, Mechanical ; Mechanics
语种英语
CSCD记录号CSCD:6403531
WOS记录号WOS:000450715600005
资助机构National Natural Science Foundation of China [11772335, 21622304, 61674045, 21203038] ; Ministry of Science and Technology (MOST) of China [2016YFA0200700] ; Distinguished Technical Talents Project ; Youth Innovation Promotion Association of Chinese Academy of Sciences
源URL[http://dspace.imech.ac.cn/handle/311007/78142]  
专题力学研究所_非线性力学国家重点实验室
作者单位1.Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100190, Peoples R China
2.Univ Chinese Acad Sci, Sch Engn Sci, Beijing 100049, Peoples R China
3.Renmin Univ China, Dept Phys, Beijing 100872, Peoples R China
4.Renmin Univ China, Beijing Key Lab Optoelect Funct Mat & Micronano D, Beijing 100872, Peoples R China
推荐引用方式
GB/T 7714
Zhang Y,Gao FF,Zheng ZY,et al. An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films[J]. ACTA MECHANICA SINICA,2018,34(6):1061-1071.
APA Zhang Y,Gao FF,Zheng ZY,&Cheng ZH.(2018).An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films.ACTA MECHANICA SINICA,34(6),1061-1071.
MLA Zhang Y,et al."An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films".ACTA MECHANICA SINICA 34.6(2018):1061-1071.

入库方式: OAI收割

来源:力学研究所

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