An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films
文献类型:期刊论文
作者 | Zhang Y(张吟); Gao FF(高斐斐); Zheng ZY; Cheng ZH |
刊名 | ACTA MECHANICA SINICA |
出版日期 | 2018-12-01 |
卷号 | 34期号:6页码:1061-1071 |
ISSN号 | 0567-7718 |
关键词 | Indentation test Film Substrate Inverse problem |
DOI | 10.1007/s10409-018-0778-8 |
英文摘要 | In an indentation test, the effective Young's modulus of a film/substrate bilayer heterostructure varies with the indentation depth, a phenomenon known as the substrate effect. In previous studies investigating this, only the Young's modulus of the film was unknown. Once the effective Young's modulus of a film/substrate structure is determined at a given contact depth, the Young's modulus of the film can be uniquely determined, i.e., there is a one-to-one relation between the Young's modulus of the film and the film/substrate effective Young's modulus. However, at times it is extremely challenging or even impossible to measure the film thickness. Furthermore, the precise definition of the layer/film thickness for a two-dimensional material can be problematic. In the current study, therefore, the thickness of the film and its Young's modulus are treated as two unknowns that must be determined. Unlike the case with one unknown, there are infinite combinations of film thickness and Young's modulus which can yield the same effective Young's modulus for the film/substrate. An inverse problem is formulated and solved to extract the Young's modulus and thickness of the film from the indentation depth-load curve. The accuracy and robustness of the inverse problem-solving method are also demonstrated. |
分类号 | 二类 |
URL标识 | 查看原文 |
WOS关键词 | ELASTIC-MODULUS ; MECHANICAL-PROPERTIES ; ADHESION MAP ; THIN-LAYERS ; CONTACT ; SUBSTRATE ; HARDNESS ; STIFFNESS ; FRICTION ; GRAPHENE |
WOS研究方向 | Engineering, Mechanical ; Mechanics |
语种 | 英语 |
CSCD记录号 | CSCD:6403531 |
WOS记录号 | WOS:000450715600005 |
资助机构 | National Natural Science Foundation of China [11772335, 21622304, 61674045, 21203038] ; Ministry of Science and Technology (MOST) of China [2016YFA0200700] ; Distinguished Technical Talents Project ; Youth Innovation Promotion Association of Chinese Academy of Sciences |
源URL | [http://dspace.imech.ac.cn/handle/311007/78142] |
专题 | 力学研究所_非线性力学国家重点实验室 |
作者单位 | 1.Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100190, Peoples R China 2.Univ Chinese Acad Sci, Sch Engn Sci, Beijing 100049, Peoples R China 3.Renmin Univ China, Dept Phys, Beijing 100872, Peoples R China 4.Renmin Univ China, Beijing Key Lab Optoelect Funct Mat & Micronano D, Beijing 100872, Peoples R China |
推荐引用方式 GB/T 7714 | Zhang Y,Gao FF,Zheng ZY,et al. An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films[J]. ACTA MECHANICA SINICA,2018,34(6):1061-1071. |
APA | Zhang Y,Gao FF,Zheng ZY,&Cheng ZH.(2018).An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films.ACTA MECHANICA SINICA,34(6),1061-1071. |
MLA | Zhang Y,et al."An inverse problem in film/substrate indentation: extracting both the Young's modulus and thickness of films".ACTA MECHANICA SINICA 34.6(2018):1061-1071. |
入库方式: OAI收割
来源:力学研究所
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