中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Calibration method of overlay measurement error caused by asymmetric mark

文献类型:期刊论文

作者Du, Juyou1; Dai, Fengzhao1; Bu, Yang1; Wang, Xiangzhao1
刊名APPLIED OPTICS
卷号57期号:33页码:9814
ISSN号1559-128X
文献子类期刊论文 ; Article
出版者OPTICAL SOC AMER
资助机构National Natural Science Foundation of China (NSFC) [61405210]; National Science and Technology Major Project of China [2017ZX02101006] ; National Natural Science Foundation of China (NSFC) [61405210]; National Science and Technology Major Project of China [2017ZX02101006]
源URL[http://ir.siom.ac.cn/handle/181231/30888]  
专题上海光学精密机械研究所_信息光学与光电技术实验室
作者单位1.Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Lab Informat Opt & Optoelect Technol, Shanghai 201800, Peoples R China
2.Univ Chinese Acad Sci, Beijing 100049, Peoples R China
推荐引用方式
GB/T 7714
Du, Juyou,Dai, Fengzhao,Bu, Yang,et al. Calibration method of overlay measurement error caused by asymmetric mark[J]. APPLIED OPTICS,57(33):9814.
APA Du, Juyou,Dai, Fengzhao,Bu, Yang,&Wang, Xiangzhao.
MLA Du, Juyou,et al."Calibration method of overlay measurement error caused by asymmetric mark".APPLIED OPTICS 57.33

入库方式: OAI收割

来源:上海光学精密机械研究所

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