Towards gamma-effect elimination in phase measurement profilometry
文献类型：期刊论文
| 作者 | Kamagara, Abel1; Wang, Xiangzhao1; Li, Sikun1 |
| 刊名 | OPTIK
 |
| 卷号 | 172页码:1089 |
| ISSN号 | 0030-4026 |
| 文献子类 | 期刊论文 ; Article |
| 出版者 | ELSEVIER GMBH, URBAN & FISCHER VERLAG |
| 资助机构 | Chinese Academy of Sciences-The World Academy of Sciences (CAS-TWAS) President's Fellowship Initiative for international doctoral students; National Science and Technology Major Project of China [2017ZX02101006] ; Chinese Academy of Sciences-The World Academy of Sciences (CAS-TWAS) President's Fellowship Initiative for international doctoral students; National Science and Technology Major Project of China [2017ZX02101006] |
| 源URL | [http://ir.siom.ac.cn/handle/181231/30878]  |
| 专题 | 上海光学精密机械研究所_信息光学与光电技术实验室 |
| 作者单位 | 1.Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China 2.Univ Chinese Acad Sci, Beijing 100039, Peoples R China |
| 推荐引用方式 GB/T 7714 | Kamagara, Abel,Wang, Xiangzhao,Li, Sikun. Towards gamma-effect elimination in phase measurement profilometry[J]. OPTIK,172:1089. |
| APA | Kamagara, Abel,Wang, Xiangzhao,&Li, Sikun. |
| MLA | Kamagara, Abel,et al."Towards gamma-effect elimination in phase measurement profilometry".OPTIK 172 |
入库方式： OAI收割
来源：上海光学精密机械研究所
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