中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
Apparatus for measuring the uniformity of the optical transmittance of a semispherical surface at normal incidence

文献类型:期刊论文

作者Wang, Shenghao; Liu, Shijie; Shao, Jianda; Xu, Tianzhu; Lu, Qi; Qi, Shen; Feng, Minghui; Zhang, Long
刊名APPLIED OPTICS
卷号57期号:13页码:3395
ISSN号1559-128X
文献子类期刊论文 ; Article
出版者OPTICAL SOC AMER
资助机构National Natural Science Foundation of China (NSFC) [61705246, 11602280] ; National Natural Science Foundation of China (NSFC) [61705246, 11602280]
源URL[http://ir.siom.ac.cn/handle/181231/30463]  
专题上海光学精密机械研究所_中科院强激光材料重点实验室
作者单位Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab mat High Power Laser, Shanghai 201800, Peoples R China
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GB/T 7714
Wang, Shenghao,Liu, Shijie,Shao, Jianda,et al. Apparatus for measuring the uniformity of the optical transmittance of a semispherical surface at normal incidence[J]. APPLIED OPTICS,57(13):3395.
APA Wang, Shenghao.,Liu, Shijie.,Shao, Jianda.,Xu, Tianzhu.,Lu, Qi.,...&Zhang, Long.
MLA Wang, Shenghao,et al."Apparatus for measuring the uniformity of the optical transmittance of a semispherical surface at normal incidence".APPLIED OPTICS 57.13

入库方式: OAI收割

来源:上海光学精密机械研究所

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