Process effects on leakage current of Si-PIN neutron detectors with porous microstructure
文献类型：期刊论文
| 作者 | Yu, Baoning; Zhao, Kangkang; Yang, Taotao; Jiang, Yong; Fan, Xiaoqiang; Lu, Min（陆敏); Han, Jun; Lu M(陆敏) |
| 刊名 | PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
 |
| 出版日期 | 2017 |
| 语种 | 英语 |
| 源URL | [http://ir.sinano.ac.cn/handle/332007/5578]  |
| 专题 | 苏州纳米技术与纳米仿生研究所_纳米加工公共平台 |
| 通讯作者 | Lu M(陆敏) |
| 推荐引用方式 GB/T 7714 | Yu, Baoning,Zhao, Kangkang,Yang, Taotao,et al. Process effects on leakage current of Si-PIN neutron detectors with porous microstructure[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE,2017. |
| APA | Yu, Baoning.,Zhao, Kangkang.,Yang, Taotao.,Jiang, Yong.,Fan, Xiaoqiang.,...&陆敏.(2017).Process effects on leakage current of Si-PIN neutron detectors with porous microstructure.PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. |
| MLA | Yu, Baoning,et al."Process effects on leakage current of Si-PIN neutron detectors with porous microstructure".PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE (2017). |
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