Investigation on the corrosive effect of NH3 during InGaN/GaN multi-quantum well growth in light emitting diodes
文献类型:期刊论文
作者 | Yang, J.; Zhao, D. G.; Jiang, D. S.; Chen, P.; Zhu, J. J.; Liu, Z. S.; Liu, W.; Li, X.; Liang, F.; Liu, S. T. |
刊名 | SCIENTIFIC REPORTS
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出版日期 | 2017 |
语种 | 英语 |
源URL | [http://ir.sinano.ac.cn/handle/332007/5491] ![]() |
专题 | 苏州纳米技术与纳米仿生研究所_纳米器件及相关材料研究部_刘建平团队 |
推荐引用方式 GB/T 7714 | Yang, J.,Zhao, D. G.,Jiang, D. S.,et al. Investigation on the corrosive effect of NH3 during InGaN/GaN multi-quantum well growth in light emitting diodes[J]. SCIENTIFIC REPORTS,2017. |
APA | Yang, J..,Zhao, D. G..,Jiang, D. S..,Chen, P..,Zhu, J. J..,...&Yang, H..(2017).Investigation on the corrosive effect of NH3 during InGaN/GaN multi-quantum well growth in light emitting diodes.SCIENTIFIC REPORTS. |
MLA | Yang, J.,et al."Investigation on the corrosive effect of NH3 during InGaN/GaN multi-quantum well growth in light emitting diodes".SCIENTIFIC REPORTS (2017). |
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