The fabrication and lasing characteristics of oxide-confined 795 nm VCSELs with close and open isolation trenches
文献类型：期刊论文
| 作者 | Sun, Y. R.（孙玉润）; Dong, J. R.（董建荣）; Zhao, Y. M.（赵勇明）; Yu, S. Z.（余淑珍）; He, Y.（何洋）; Huang, J.（黄俊）; Dong JR(董建荣) |
| 刊名 | OPTICAL AND QUANTUM ELECTRONICS
 |
| 出版日期 | 2017 |
| 语种 | 英语 |
| 源URL | [http://ir.sinano.ac.cn/handle/332007/5653]  |
| 专题 | 苏州纳米技术与纳米仿生研究所_纳米器件及相关材料研究部_董建荣团队 |
| 通讯作者 | Dong JR(董建荣) |
| 推荐引用方式 GB/T 7714 | Sun, Y. R.,Dong, J. R.,Zhao, Y. M.,et al. The fabrication and lasing characteristics of oxide-confined 795 nm VCSELs with close and open isolation trenches[J]. OPTICAL AND QUANTUM ELECTRONICS,2017. |
| APA | Sun, Y. R..,Dong, J. R..,Zhao, Y. M..,Yu, S. Z..,He, Y..,...&董建荣.(2017).The fabrication and lasing characteristics of oxide-confined 795 nm VCSELs with close and open isolation trenches.OPTICAL AND QUANTUM ELECTRONICS. |
| MLA | Sun, Y. R.,et al."The fabrication and lasing characteristics of oxide-confined 795 nm VCSELs with close and open isolation trenches".OPTICAL AND QUANTUM ELECTRONICS (2017). |
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