In-situ investigation of the semiconductive properties and protective role of Cu2O layer formed on copper in a borate buffer solution
文献类型:期刊论文
作者 | Xiao, Kui; Dong, Chaofang; Yi, Pan; Li, Xiaogang; Man, Cheng |
刊名 | JOURNAL OF ELECTROANALYTICAL CHEMISTRY
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出版日期 | 2018 |
卷号 | 809页码:52-58 |
关键词 | Mott-schottky Analysis 316l Stainless-steel 0.1 m Naoh Passive Film Alkaline-solution Photoelectrochemical Properties Electrochemical-behavior Corrosion-resistance Acidic-solution Temperature |
英文摘要 | The semiconductor properties and protective role of a single-component Cu2O layer were studied using cyclic voltammetry, Mott Schottky (MS) tests, electrochemical impedance spectroscopy (EIS), in-situ laser Raman spectroscopy, and electrochemical atomic force microscopy techniques (ECAFM). The results suggest that the single-component Cu2O layer exhibits p-type semiconductor properties. An interesting phenomenon was observed; the carrier concentration, and the diffusivity of the Cu+ vacancies increased progressively as the oxide layer formation potential increased. The oxide layer was composed of granular cuprous oxide; relatively large Cu2O particles were formed on the surface under -120 mV (Ag/AgCI) and -60 mV (Ag/AgCl). At a film formation potential of -120 mV (Ag/AgCl), the thickness of the oxide layer (Cu2O) was approximately 6.046 nm, while it was 0.5594 nm at 0 mV (Ag/AgCl). The Cu2O layer formed at a lower potential offers superior stability and protection. |
学科主题 | Science & Technology - Other Topics |
语种 | 英语 |
公开日期 | 2018-12-04 |
源URL | [http://ir.nimte.ac.cn/handle/174433/16867] ![]() |
专题 | 2018专题 |
推荐引用方式 GB/T 7714 | Xiao, Kui,Dong, Chaofang,Yi, Pan,et al. In-situ investigation of the semiconductive properties and protective role of Cu2O layer formed on copper in a borate buffer solution[J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY,2018,809:52-58. |
APA | Xiao, Kui,Dong, Chaofang,Yi, Pan,Li, Xiaogang,&Man, Cheng.(2018).In-situ investigation of the semiconductive properties and protective role of Cu2O layer formed on copper in a borate buffer solution.JOURNAL OF ELECTROANALYTICAL CHEMISTRY,809,52-58. |
MLA | Xiao, Kui,et al."In-situ investigation of the semiconductive properties and protective role of Cu2O layer formed on copper in a borate buffer solution".JOURNAL OF ELECTROANALYTICAL CHEMISTRY 809(2018):52-58. |
入库方式: OAI收割
来源:宁波材料技术与工程研究所
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