中国科学院机构知识库网格
Chinese Academy of Sciences Institutional Repositories Grid
In-situ investigation of the semiconductive properties and protective role of Cu2O layer formed on copper in a borate buffer solution

文献类型:期刊论文

作者Xiao, Kui; Dong, Chaofang; Yi, Pan; Li, Xiaogang; Man, Cheng
刊名JOURNAL OF ELECTROANALYTICAL CHEMISTRY
出版日期2018
卷号809页码:52-58
关键词Mott-schottky Analysis 316l Stainless-steel 0.1 m Naoh Passive Film Alkaline-solution Photoelectrochemical Properties Electrochemical-behavior Corrosion-resistance Acidic-solution Temperature
英文摘要The semiconductor properties and protective role of a single-component Cu2O layer were studied using cyclic voltammetry, Mott Schottky (MS) tests, electrochemical impedance spectroscopy (EIS), in-situ laser Raman spectroscopy, and electrochemical atomic force microscopy techniques (ECAFM). The results suggest that the single-component Cu2O layer exhibits p-type semiconductor properties. An interesting phenomenon was observed; the carrier concentration, and the diffusivity of the Cu+ vacancies increased progressively as the oxide layer formation potential increased. The oxide layer was composed of granular cuprous oxide; relatively large Cu2O particles were formed on the surface under -120 mV (Ag/AgCI) and -60 mV (Ag/AgCl). At a film formation potential of -120 mV (Ag/AgCl), the thickness of the oxide layer (Cu2O) was approximately 6.046 nm, while it was 0.5594 nm at 0 mV (Ag/AgCl). The Cu2O layer formed at a lower potential offers superior stability and protection.
学科主题Science & Technology - Other Topics
语种英语
公开日期2018-12-04
源URL[http://ir.nimte.ac.cn/handle/174433/16867]  
专题2018专题
推荐引用方式
GB/T 7714
Xiao, Kui,Dong, Chaofang,Yi, Pan,et al. In-situ investigation of the semiconductive properties and protective role of Cu2O layer formed on copper in a borate buffer solution[J]. JOURNAL OF ELECTROANALYTICAL CHEMISTRY,2018,809:52-58.
APA Xiao, Kui,Dong, Chaofang,Yi, Pan,Li, Xiaogang,&Man, Cheng.(2018).In-situ investigation of the semiconductive properties and protective role of Cu2O layer formed on copper in a borate buffer solution.JOURNAL OF ELECTROANALYTICAL CHEMISTRY,809,52-58.
MLA Xiao, Kui,et al."In-situ investigation of the semiconductive properties and protective role of Cu2O layer formed on copper in a borate buffer solution".JOURNAL OF ELECTROANALYTICAL CHEMISTRY 809(2018):52-58.

入库方式: OAI收割

来源:宁波材料技术与工程研究所

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