Dynamic metrology and data processing for precision freeform optics fabrication and testing
文献类型：会议论文
| 作者 | Aftab, Maham1; Trumper, Isaac1; Huang, Lei2; Choi, Heejoo1; Zhao, Wenchuan3; Graves, Logan1; Oh, Chang Jin1; Kim, Dae Wook1,4 |
| 出版日期 | 2017 |
| 关键词 | Adaptive optics - Data processing - Gradient methods - Manufacture - Measurements - Optical systems - Optical testing - Stochastic systems - Units of measurement |
| 卷号 | 10326 |
| 页码 | 103260H |
| 英文摘要 | Dynamic metrology holds the key to overcoming several challenging limitations of conventional optical metrology, especially with regards to precision freeform optical elements. We present two dynamic metrology systems: 1) adaptive interferometric null testing; and 2) instantaneous phase shifting deflectometry, along with an overview of a gradient data processing and surface reconstruction technique. The adaptive null testing method, utilizing a deformable mirror, adopts a stochastic parallel gradient descent search algorithm in order to dynamically create a null testing condition for unknown freeform optics. The single-shot deflectometry system implemented on an iPhone uses a multiplexed display pattern to enable dynamic measurements of time-varying optical components or optics in vibration. Experimental data, measurement accuracy / precision, and data processing algorithms are discussed. © 2017 SPIE. |
| 会议录 | 0277-786X
 |
| 语种 | 英语 |
| 源URL | [http://ir.ioe.ac.cn/handle/181551/9031]  |
| 专题 | 光电技术研究所_先光中心 |
| 作者单位 | 1.College of Optical Sciences, University of Arizona, Tucson; AZ; 85721, United States; 2.Department of Precision Instruments, Tsinghua University, Beijing; 100084, China; 3.Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu; 610209, China; 4.Steward Observatory, University of Arizona, Tucson; AZ; 85721, United States |
| 推荐引用方式 GB/T 7714 | Aftab, Maham,Trumper, Isaac,Huang, Lei,et al. Dynamic metrology and data processing for precision freeform optics fabrication and testing[C]. 见:. |
入库方式： OAI收割
来源：光电技术研究所
浏览0
下载0
收藏0
其他版本
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。