Spectroscopic ellipsometry investigationsof PLT ferroelectric thin films with various La concentrations in the mid-infrared spectral region
文献类型：期刊论文
| 作者 | z.g. hu; f.w. shi; z.m. huang; y.n.wu; g.s.wang; j.h. chu |
| 刊名 | Applied Physics A
 |
| 出版日期 | 2005 |
| 卷号 | 80 |
| 公开日期 | 2011-11-08 |
| 源URL | [http://202.127.1.142/handle/181331/2830]  |
| 专题 | 上海技术物理研究所_上海技物所 |
| 推荐引用方式 GB/T 7714 | z.g. hu,f.w. shi,z.m. huang,et al. Spectroscopic ellipsometry investigationsof PLT ferroelectric thin films with various La concentrations in the mid-infrared spectral region[J]. Applied Physics A,2005,80. |
| APA | z.g. hu,f.w. shi,z.m. huang,y.n.wu,g.s.wang,&j.h. chu.(2005).Spectroscopic ellipsometry investigationsof PLT ferroelectric thin films with various La concentrations in the mid-infrared spectral region.Applied Physics A,80. |
| MLA | z.g. hu,et al."Spectroscopic ellipsometry investigationsof PLT ferroelectric thin films with various La concentrations in the mid-infrared spectral region".Applied Physics A 80(2005). |
入库方式： OAI收割
来源：上海技术物理研究所
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