Determination of Carrier-Transfer Length from Side-Wall Quantum Well to Quantum Wire by Micro-Photoluminescence Scanning
文献类型：期刊论文
| 作者 | Z.-F. LI; W. LU; X.-Q. LIU; X.-S. CHEN; S.C. SHEN; Y. FU; M. WILLANDER; H.H. TAN; C. JAGADISH |
| 刊名 | Journal of Electronic Materials
 |
| 出版日期 | 2003 |
| 卷号 | 32期号:8 |
| WOS记录号 | WOS:000184610800015 |
| 公开日期 | 2011-11-30 |
| 源URL | [http://202.127.1.142/handle/181331/3409]  |
| 专题 | 上海技术物理研究所_上海技物所 |
| 推荐引用方式 GB/T 7714 | Z.-F. LI,W. LU,X.-Q. LIU,et al. Determination of Carrier-Transfer Length from Side-Wall Quantum Well to Quantum Wire by Micro-Photoluminescence Scanning[J]. Journal of Electronic Materials,2003,32(8). |
| APA | Z.-F. LI.,W. LU.,X.-Q. LIU.,X.-S. CHEN.,S.C. SHEN.,...&C. JAGADISH.(2003).Determination of Carrier-Transfer Length from Side-Wall Quantum Well to Quantum Wire by Micro-Photoluminescence Scanning.Journal of Electronic Materials,32(8). |
| MLA | Z.-F. LI,et al."Determination of Carrier-Transfer Length from Side-Wall Quantum Well to Quantum Wire by Micro-Photoluminescence Scanning".Journal of Electronic Materials 32.8(2003). |
入库方式： OAI收割
来源：上海技术物理研究所
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