Characterization of the crystallization behaviors in the PbTiO3 thin films on Si substrates by an infrared spectroscopy technique
文献类型：期刊论文
| 作者 | Xiangjian Meng; Jiangong Cheng; Hongjuan Ye; Junhao Chu |
| 刊名 | Infrared Physics & Technology
 |
| 出版日期 | 2000 |
| 卷号 | 41 |
| WOS记录号 | WOS:000085309700008 |
| 公开日期 | 2011-11-30 |
| 源URL | [http://202.127.1.142/handle/181331/3579]  |
| 专题 | 上海技术物理研究所_上海技物所 |
| 推荐引用方式 GB/T 7714 | Xiangjian Meng,Jiangong Cheng,Hongjuan Ye,et al. Characterization of the crystallization behaviors in the PbTiO3 thin films on Si substrates by an infrared spectroscopy technique[J]. Infrared Physics & Technology,2000,41. |
| APA | Xiangjian Meng,Jiangong Cheng,Hongjuan Ye,&Junhao Chu.(2000).Characterization of the crystallization behaviors in the PbTiO3 thin films on Si substrates by an infrared spectroscopy technique.Infrared Physics & Technology,41. |
| MLA | Xiangjian Meng,et al."Characterization of the crystallization behaviors in the PbTiO3 thin films on Si substrates by an infrared spectroscopy technique".Infrared Physics & Technology 41(2000). |
入库方式： OAI收割
来源：上海技术物理研究所
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