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Dielectric responses and scaling behaviors in Aurivillius Bi6Ti3Fe2O18 multiferroic thin films
文献类型:期刊论文
作者 | Bai, W; Chen, G; Zhu, JY; Yang, J; Lin, T; Meng, XJ; Tang, XD; Duan, CG; Chu, JH |
刊名 | APPLIED PHYSICS LETTERS
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出版日期 | 2012 |
卷号 | 100期号:8 |
英文摘要 | Dielectric responses and scaling behaviors of Aurivillius Bi6Ti3Fe2O18 (BTF2) multiferroic thin films were systemically detailed by the temperature-dependent dielectric/impedance spectroscopy. We clarified two dielectric relaxation processes presented in grain interior of the BTF2 films. One relaxation below similar to 500K was proposed to associate with the localized hopping process of carrier between Fe3+ and Fe2+ inside the grains. Another one above similar to 500K arose from the long-range movement of oxygen vacancies. The scaling behaviors implied that the distribution of relaxation times for oxygen vacancies was temperature independent while the dynamical processes for the hopping carriers presumably depended on temperature. (C) 2012 American Institute of Physics. [doi:10.1063/1.3688033] |
WOS记录号 | WOS:000300711200040 |
公开日期 | 2013-03-18 |
源URL | [http://202.127.1.142/handle/181331/7133] ![]() |
专题 | 上海技术物理研究所_上海技物所 |
推荐引用方式 GB/T 7714 | Bai, W,Chen, G,Zhu, JY,et al. Dielectric responses and scaling behaviors in Aurivillius Bi6Ti3Fe2O18 multiferroic thin films[J]. APPLIED PHYSICS LETTERS,2012,100(8). |
APA | Bai, W.,Chen, G.,Zhu, JY.,Yang, J.,Lin, T.,...&Chu, JH.(2012).Dielectric responses and scaling behaviors in Aurivillius Bi6Ti3Fe2O18 multiferroic thin films.APPLIED PHYSICS LETTERS,100(8). |
MLA | Bai, W,et al."Dielectric responses and scaling behaviors in Aurivillius Bi6Ti3Fe2O18 multiferroic thin films".APPLIED PHYSICS LETTERS 100.8(2012). |
入库方式: OAI收割
来源:上海技术物理研究所
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