Investigation on optical properties of NiMn2O4 films by spectroscopic ellipsometry
文献类型：期刊论文
| 作者 | L.B.Zhang Y.Hou W.Zhou Y.Q.Gao J.Wu Z.M.Huangn J.H.Chu |
| 刊名 | Solid State Commun.
 |
| 出版日期 | 2013 |
| 卷号 | 159期号:0 |
| 关键词 | 1nimn2o4 2oxidation 3opticalproperties 4spectroscopicellipsometry |
| 英文摘要 | Two different thicknesses of NiMn2O4 thin films were prepared on Pt (111)/Ti/SiO2/Si substrate by chemical solution deposition method. The microstructure of NiMn2O4 films was characterized by x-ray diffraction and scanning electron microscopy. The optical properties of the films were studied by spectroscopic ellipsometry at room temperature in the spectral range of 300–1700 nm. Double Tauc–Lorentz dispersion function was successfully adopted to describe the optical properties of the NiMn2O4 films. The refractive index, extinction coefficient and absorption coefficient of NiMn2O4 thin films were obtained by fitting the experimental data in the entirely measured wavelength range. The variation of the optical properties for different thicknesses was discussed. It was mainly attributed to different oxidation states originate from grown process. The results are meaningful to the understanding and optoelectronic applications of NiMn2O4 films. |
| 学科主题 | 红外基础研究 |
| 公开日期 | 2014-11-10 |
| 源URL | [http://202.127.1.142/handle/181331/7750]  |
| 专题 | 上海技术物理研究所_上海技物所 |
| 推荐引用方式 GB/T 7714 | L.B.Zhang Y.Hou W.Zhou Y.Q.Gao J.Wu Z.M.Huangn J.H.Chu. Investigation on optical properties of NiMn2O4 films by spectroscopic ellipsometry[J]. Solid State Commun.,2013,159(0). |
| APA | L.B.Zhang Y.Hou W.Zhou Y.Q.Gao J.Wu Z.M.Huangn J.H.Chu.(2013).Investigation on optical properties of NiMn2O4 films by spectroscopic ellipsometry.Solid State Commun.,159(0). |
| MLA | L.B.Zhang Y.Hou W.Zhou Y.Q.Gao J.Wu Z.M.Huangn J.H.Chu."Investigation on optical properties of NiMn2O4 films by spectroscopic ellipsometry".Solid State Commun. 159.0(2013). |
入库方式： OAI收割
来源：上海技术物理研究所
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