Interface Stability of Skutterudite Thermoelectric Materials/Ti88Al12
文献类型:期刊论文
作者 | Zhang Qi-Hao; Liao Jin-Cheng; Tang Yun-Shan; Gu Ming; Liu Rui-Heng; Bai Sheng-Qiang; Chen Li-Dong |
刊名 | JOURNAL OF INORGANIC MATERIALS
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出版日期 | 2018 |
卷号 | 33期号:8页码:889 |
关键词 | skutterudite interface stability barrier layer contact resistivity |
ISSN号 | 1000-324X |
DOI | 10.15541/jim20170517 |
英文摘要 | Interface stability is one of the key issues determining the service reliability and life of thermoelectric devices. For skutterudite-based thermoelectric devices, the barrier layer is required in order to restrain the inter-diffusion between the hot-side electrode and skutterudite matrix. In this work, Ti88Al12 was selected as the barrier layer. N-type Yb0.3Co4Sb12/Ti88Al12/Yb0.3Co4Sb12 and p-type CeFe3.85Mn0.15Sb12/Ti88Al12/CeFe3.85Mn0.15Sb12 thermoelectric joints were prepared by one-step hot pressing sintering method. The evolution processes of contact resistivity and microstructure were studied through accelerated aging experiments. The results show that the contact resistivity of n-type joints increases slower than that of p-type joints under the same aging condition. Activation energy for n-type and p-type joints is 84.1 kJ/mol and 68.8 kJ/mol, respectively. Growth of the inter-metallic compound layer and cracking at the AlCo/TiCoSb interface result in rapidly increased contact resistivity of n-type joints. For p-type joints, the difference of coefficient of thermal expansion between CeFe3.85Mn0.15Sb12 and Ti88Al12 becomes the main reason for the cracks. |
学科主题 | Materials Science, Ceramics |
WOS记录号 | WOS:000439106600012 |
出版者 | SCIENCE PRESS |
资助机构 | National Natural Science Foundation of China (51632010, 51572282, 51404236). ; National Natural Science Foundation of China (51632010, 51572282, 51404236). |
源URL | [http://ir.sic.ac.cn/handle/331005/24726] ![]() |
专题 | 中国科学院上海硅酸盐研究所 |
作者单位 | 1.[Zhang Qi-Hao 2.Liao Jin-Cheng 3.Tang Yun-Shan 4.Gu Ming 5.Liu Rui-Heng 6.Bai Sheng-Qiang 7.Chinese Acad Sci, Shanghai Inst Ceram, State Key Lab High Performance Ceram & Superfine, Shanghai 200050, Peoples R China 8.Univ Chinese Acad Sci, Beijing 100049, Peoples R China |
推荐引用方式 GB/T 7714 | Zhang Qi-Hao,Liao Jin-Cheng,Tang Yun-Shan,et al. Interface Stability of Skutterudite Thermoelectric Materials/Ti88Al12[J]. JOURNAL OF INORGANIC MATERIALS,2018,33(8):889, 894. |
APA | Zhang Qi-Hao.,Liao Jin-Cheng.,Tang Yun-Shan.,Gu Ming.,Liu Rui-Heng.,...&Chen Li-Dong.(2018).Interface Stability of Skutterudite Thermoelectric Materials/Ti88Al12.JOURNAL OF INORGANIC MATERIALS,33(8),889. |
MLA | Zhang Qi-Hao,et al."Interface Stability of Skutterudite Thermoelectric Materials/Ti88Al12".JOURNAL OF INORGANIC MATERIALS 33.8(2018):889. |
入库方式: OAI收割
来源:上海硅酸盐研究所
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